Demonstrations this Friday, August 12, 3:00-6:00PM
The benchtop XRD from Rigaku is now available for use in the MCF and is on SUMS! More information about the instrument can be found here! This Friday, August 12, from 3:00-6:00, David Tavakoli will be demonstrating the capabilities of the newest XRD on campus. If you have samples you would like to try or are curious and want to know more, please make an appointment.
Join us Tuesday, March 29, for a free atomic force microscopy (AFM), nanoscale infrared (AFM-IR) spectroscopy, and nanoindentation workshop at the Georgia Institute of Technology. During the workshop, we will explore the latest advances in AFM, BioAFM, AFM-IR, nanoindentation technologies, and perform hands-on demonstrations with Bruker’s Dimension Icon AFM.
Our current set of XRD instruments, while capable and well-maintained, are beyond their design lifetime and – save for the Empyrean – are no longer supported by the OEM. At the same time, we have had extensive conversations with faculty on campus who want to do more advanced XRD measurements than our current tools will support.
To address both issues: We have some big news to share. With the financial and technical support of the EVPR and Prof. M. Mourigal, the MCF is acquiring three new XRD systems from Rigaku to be housed in the Marcus Microanalysis lab in the MCF. This acquisition will add or extend capabilities for:
Cryo measurements (down to LHe temps)
Auto-samplers for multi-sample measurements.
Though there will be a learning curve for the new data analysis SW, researchers will be able to do that analysis on their own computers instead of having to use the one central system in the MCF lab.
Not to bury the lede, but to prepare for the installation of the the XRDs, the existing PANalytical instruments will be moving to the Paper Tricentennial Building the week of March 6th. We anticipate that they will be down from March 6 to March 10, and should be available for use by Monday, March 13th. Please plan to complete your XRD work by Sunday, March 5th.
There will be a transition of MCF support from the Panalytical systems to the Rigaku systems over the rest of calendar year 2022, but there should always be an operational PXRD and single-crystal system available in the MCF.
We want to stress that we are not losing any currently available capabilities and are adding several advanced measurement modes. The new instruments give us flexibility to augment with additional capabilities over time.
Please contact David Tavakoli or another member of the MCF staff if you have any questions or concerns.
The Crystalmaker Software suite is available for download for students and staff at Georgia Tech! The crystalmaker suite will enable you to create crystal models, simulate XRD patterns, and generate CIFs. For the codes, please contact David Tavakoli (firstname.lastname@example.org) from a GT email address.
The New Raman Renishaw Particle Analysis Software – Targeted Raman Data Collection
Wednesday, September 30th – 2:00pm (EST)
Renishaw’s upcoming Particle Analysis software enables targeted Raman data collection from optical image contrast. This approach ensures data is only collected from the areas of interest, making it a fast and automated method.
In this webinar, we will show how the diverse high performing optical contrast methods of the inVia Raman microscope can be used to quickly, easily, and automatically report particle identities and morphology together. Applied to a diverse range of applications, from microplastics to materials and forensics to pharmaceuticals, see how Particle Analysis can benefit your work.
This webinar will be broadcast in the MCF Lobby in the Marcus Nanotechnology Building.
Rigaku will be hosting a virtual conference on XRD and XRF this week that is free to register here!
Due to the COVID-19 induced cancellations of the Microscopy & MicroAnalysis, Denver X-ray, and American Crystallographic Association physical conferences this summer, Rigaku will be live webcasting a 3-day virtual Analytical X-ray Convention from our laboratory facility in Texas. The webcasts will take place Tuesday 8/4 – Thursday 8/6 and will feature live seminars on X-ray techniques and live instrument demonstrations.
Enjoy the presentations on Channel 1 (XRD), Channel 2 (XRF) and Channel 3 (X-ray Microscopy), and make sure to stop by our Concierge Booth on Channel 4 to say hello, live video chat, and participate in some fun events. We will be announcing upcoming Channel 4 events on the channel itself and via our Rigaku twitter feed (@rigaku, hashtag #RAXC2020), which you can view see on the right to keep up to date with what is going on.
Check the starting times for each day in the program, as different channels have different starting times. All four channels will be broadcast simultaneously and you can move among the four booths using the channel links.
Note that the three guest presentations—to be given by Rigaku sponsors—will all take place on channel 3. This has been updated on the program schedule.
The MCF Staff look forward to welcoming our users back to campus and hope you are all safe and well.
From the office of the EVPR:
Research Ramp-Up Details
As part of a careful, gradual return to campus operations, research ramp-up activities are anticipated to begin as early as June 18. Only researchers and staff who must return to campus in order to carry out their job duties should return to work on campus. Supervisors will provide specific direction to their teams on when to return to in-person work. Anyone with questions about when or how they should start reporting to work in-person should, first, ask their supervisor.
If you have been identified by your supervisor to return to your lab, or if you have been working in one of the labs that has remained open, you will be required to watch the “Returning Safely to Your Lab” videos. The six-part module will include what you can expect, recommended safety precautions, cleaning and disinfection best practices, and proper use and disposal of PPE, among other helpful tips for best ensuring your safety and the safety of others.
The cathode in a lithium-ion battery undergoes unique electrochemical reactions as lithium enters and leaves the atomic structure of the intercalated lithium compound. The intricacies of this reaction are one source of degradation and, therefore, an opportunity to improve performance. X-ray diffraction and scattering is well-suited to study these atomic phase changes, as well as a tool to understand and optimize the pathways that lithium uses to move through the cathode. However, studying battery materials requires special considerations that are different than the routine powder diffraction measurement.
This webinar, hosted by Malvern PANalytical will review the information that X-ray diffraction and scattering provides and discuss special considerations for experimental design such as selecting an X-ray tube, measurement geometry, and sample holder. We will then show examples of how these considerations are applied to cathode material analysis, including Rietveld refinement to quantify phase mixtures and atomic structure, pair distribution function analysis to examine local structural defects, and phase analysis of thick (10mm) commercial pouch cells, and in operando analysis of LFP based batteries to track phase changes during discharge and charging.
Dr. Scott Speakman – Principal Scientist Malvern Panalytical
and Dr. Reeves-McLaren of The University of Sheffield
– Who should attend?
Those working within the field of battery research or manufacturing or anyone interested in X-ray Diffraction of materials.
– What will you learn?
You will be educated on the X-ray diffraction and scattering application of lithium-ion batteries, including: Electrochemical reactions and atomic phase changes, with discussion on the special considerations needed for this application.
From the classroom to the laboratory to the synchrotron: SingleCrystal is the easiest way to visualize and understand diffraction properties of crystals. SingleCrystal 4 lets you simulate multi-phase X-ray, neutron and electron diffraction patterns, display reciprocal lattice sections and construct stereographic projections of planes or vectors. By combining a simulated pattern with an observed diffraction image, you can auto-index the pattern and determine the orientation of your crystal.