Join us Tuesday, March 29, for a free atomic force microscopy (AFM), nanoscale infrared (AFM-IR) spectroscopy, and nanoindentation workshop at the Georgia Institute of Technology. During the workshop, we will explore the latest advances in AFM, BioAFM, AFM-IR, nanoindentation technologies, and perform hands-on demonstrations with Bruker’s Dimension Icon AFM.
Please register for our workshop at this link!
If you would like to download the flyer, you can do so here.
Bruker Dimension Icon Scanning Probe Microscopy
Performs all major SPM imaging like…
- Peak Force Tapping
- Contact Mode
- Lateral Force Mode (LFM)
- Electric Force Mode (EFM)
- Magnetic Force Mode (MFM)
- Fluid Imaging
- Kelvin Probe Microscopy (KPFM)
- Phase Imaging
- Lift Mode
- Force Spectroscopy
- Force Volume
- Surface Potential
- Torsional Resonance (TR) Mode
- Piezoresponse Microscopy
Samples up to 210 mm in dia/ 15 mm thick; Vertical range (Z) upto 13 microns; X,Y scan range -90 x 90 microns
- Can measure ultra low current between probe tip and sample using PeakForce TUNA Mode.
- Can measure variation in conductivity and locate electrical defects of conductive samples using CAFM Mode.
- New DataCube TUNA & SCM Modes provide Nanoelectrical & Nanomechanical spectra at every point.
- Force Volume & Scan Asyst Probe Capabilities with user friendly software.