Thermo Axia ChemiSEM

Thermo Fisher Axia ChemiSEM

illustrate the Axia ChemiSEM
Thermo Fisher Axia ChemiSEM variable pressure SEM

The Axia ChemiSEM scanning electron microscope has a thermionic tungsten filament source and automated alignment, automated sample navigation, variable pressure feature, a backscatter detector, and live quantitative elemental mapping. The ChemiSEM always collects energy dispersive spectroscopy (EDS) data in the background, displaying the morphology and elemental makeup of a sample in real time, speeding up workflow.  Elements found in the sample may be toggled on or off, to emphasize or isolate elements and regions of the sample.

It comes with a control panel, for manual control and alignment touch-up; the SmartAlign technology minimizes the beam alignment steps.

  • Infrared chamber camera
  • Nav-Cam:     color optical camera for sample navigation
  • TrueSight energy dispersive spectrometer

If you would like training on the Axia ChemiSEM and have a GT Login; click HERE and click on the Training Requirements button.

SEM image of tufa mineral
Secondary electron image of tufa mineral
Elemental x-ray map of tufa mineral area shown in image to the left
Elemental x-ray map of tufa mineral
  • Motorized retractable backscatter detector
Himalayan rock, garnet, ssecondary electron image
Secondary electron image of Himalayan rock garnet
Himalayan rock garnet, demonstrating backscattered electron image
Backscattered electron image of Himalayan rock garnet
Himalayan rock garnet, illustrating elemental map
ChemiSEM elemental map of Himalayan rock garnet
  • Low vacuum + variable pressure (up to 1.13 torr)
Non-conducting, polished zircon sample, imaged at high vacuum and 15 kV
Non-conductive, polished zircon particles, showing surface charge at 15 kV and high vacuum
Non-conductive, polished zircon particles, showing surface detail at 15 kV and 0.75 Torr pressure
Non-conductive, polished zircon particles, showing surface detail at 15 kV and 0.75 Torr pressure
  • Maps software for tiling and stitching 
System Details

Resolution 

  • 3.0 nm @ 30 kV (SE) 
  • 3.0 nm @ 30 kV (SE) (low vacuum) 
  • 8.0 nm @ 3 kV (SE) 
  • 7.0 nm @ 3 kV (BD mode* + BSE) 
  • Stage: 120 x 120 mm; however flexible, accommodating samples up to 10 kg with x-y movement 
  • Stage Tilt: -15 to +90 degrees 
  • Rotation: n x 360 degrees

 

Operating Instructions