The Materials Characterization Facility (MCF) is pleased to announce that in January, in collaboration with Rigaku, we will be hosting a workshop on X-ray Diffraction. January 5th will feature seminars from researchers and faculty at Georgia Tech and across the southeast including but not limited to Clemson, Emory, Florida State University, and JSNN. January 6th will feature hands on training and application of techniques and showing off the capabilities of the tools and the software.
Registration information will be posted on the MCF (mcf.gatech.edu) website as well on the Rigaku website.
We look forward to seeing you at our workshop in the New Year!
The MCF has acquired the new codes for the Crystalmaker Software suite and it is available for download for students and staff at Georgia Tech! The crystalmaker suite will enable you to create crystal models, simulate XRD patterns, and generate CIFs. For the codes, please contact David Tavakoli (firstname.lastname@example.org) from a GT email address. The codes will also be available from OIT in the new year.
The Crystalmaker Software suite is available for download for students and staff at Georgia Tech! The crystalmaker suite will enable you to create crystal models, simulate XRD patterns, and generate CIFs. For the codes, please contact David Tavakoli (email@example.com) from a GT email address.
X-Ray Diffraction (XRD) is a powerful tool to look at crystals for characterizing microstructural and crystallographic properties of powders, thin films, fibers and other solid materials. The MCF has recently added another XRD, a Malvern PANalytical MPD to its capabilities. This XRD has a flat sample stage (default) for the analysis of powders and small solids, a non-ambient stage capable of running from -196C-450C, and a reflectivity stage. It should be on SUMS no later than 8/12/2019!
If you are interested in learning the basics of quantitative analysis using HighScore Plus X-ray Diffraction software, then join us for a free webinar. This webinar will introduce standard XRD quantitative methods, as well as the newest quantitative methods implemented in HighScore Plus software, such as Partial Least Squares Refinement (PLSR), Autoscaler Method (FULLPAT), and Direct Derivation Method after Toraya.
At the conclusion of the presentation a live question and answer session will be held. So do not miss this opportunity to learn about the newest methods for quantification by XRD, and which may be best suited to your types of materials.
This webinar will be broadcast in the lobby of the MCF in the Marcus Nanotechnology Building.
Date: February 6, 2018 Title: Introduction to quantitative XRD methods using HighScore Plus Time: 10:00 AM EDT / 7:00 AM PDT Duration: 45 minutes Presenter: Dr. Anasuya Adibhatla Ph.D, XRD application specialist, Malvern Panalytical
The MCF has acquired a site license for Georgia Tech for the Crystalmaker Software Suite (Crystalmaker, CrystalDiffract, and Single Crystal) for mac and windows. This is a powerful software package that allows you to create CIF patterns of materials as well as nice images of your crystals for presentations/publications.
If you aren’t familiar with it, more information can be found here:
We are going to be hosting it on the OIT website in the near future, but if you would like to get your new licenses for next year or get a copy of it before we host it there, please contact me.
Introduction to Practical X-ray Powder Diffractometry
This presentation teaches the basic principles of X-ray diffraction and what information can be learned from an X-ray diffraction pattern. This presentation does not delve deeply into the mathematics or physics of diffraction, but rather focuses on illustrating the power of this materials analysis technique. It is intended for a broad audience—technicians, managers, students, professor moving from single crystal diffractometry into powder diffractometry, and those who are considering if X-ray diffraction could be a beneficial addition to their lab.
X-Ray Powder Diffraction is most often used to answer the questions: what is in the sample and how much? With modern diffractometers, it is possible to load a sample, push a single button, and get an answer. But … where did that answer come from? How reliable is it? What other information might be available in the data? This talk will dissect the X-ray powder diffraction pattern and show the wealth of information contained within.
The Aeris is a benchtop XRD capable of quick high resolution scans on powder samples or small solid samples. Conveniently it operates without the need of chiller water to operate and doesn’t have any exotic power requirements. Malvern PANalytical graciously allowed the Aeris to be housed in the Marcus Building and let students use it free of charge and several groups took advantage of it.
Malvern PANalytical has graciously housed the Aeris, their new benchtop XRD in the lab across from the Alpha-1. The Aeris is a easy to use XRD designed to run powder/pellet samples. This tool is free to use, and if you would like to get trained on it see how it runs your samples, please contact David Tavakoli (firstname.lastname@example.org) Tuesday or Wednesday of this week. Unfortunately on Thursday it will be shipped out to another lab.