Electron Microscopy

• Yolande Berta
• Yong Ding (Hi-Res TEM)
• Mengkun Tian (TEM)
• Todd Walters
• Eric Woods (FIB-SEM)
• Tiejun “Tim” Zhang

• yolande.berta at mse.gatech.edu
• yong.ding@mse.gatech.edu
• mtian37 at gatech.edu
• todd@gatech.edu
• eric.woods at ien.gatech.edu
• tiejun.zhang@mse.gatech.edu

• 404-894-2545
• 404-385-7464
• 404-385-0002
• 404-895-9723
• 404-312-0096
• 404-477-9825

AFM,

Surface Science, FTIR,

Optical & Raman Microscopy

• Rebhadevi “Rathi” Monikandan
• Erin Prowett
• Walter Henderson

• rjeevagan3@gatech.edu
• ec82@gatech.edu
• walter.henderson@gatech.edu

• 404-385-2889
• 770-744-9386
• 404-309-8023

XRD

• David Tavakoli
• Walter Henderson

• david.tavakoli@mse.gatech.edu
• walter.henderson@gatech.edu

• 770-689-6840
• 404-309-8023

Sample Prep

• Yong Ding

• yong.ding@mse.gatech.edu

• 404-385-7464

General ?s

• Walter Henderson

• walter.henderson@gatech.edu

• 404-309-8023