Hitachi HD-2700 STEM/SEM

Atomic-Resolution Imaging and Analysis

Hitachi HD-2700 STEM

The HD-2700 is an aberration-corrected 80-200 kV field emission gun scanning transmission electron microscope (STEM) with secondary electron (SE) imaging capability. Bulk and surface structures of specimen can be imaged simultaneously. Ultra-high resolution can be achieved for both STEM and SE imaging. The Hitachi corrector minimizes the user’s effort in doing aberration correction. Large solid angle EDS spectrum imaging are enabled.

  • True atomic-resolution SEM imaging through correction of spherical aberration.
  • Atomic resolution Bright-field, Dark-field, and SEM simultaneous imaging
  • Diffraction contrast-enchanced imaging mode for defect observation.
  • Bruker SDD EDS detector with 60 sq. mm area for a ~0.3 steradian solid angle

 

  • ______________________ Pyramidal void in ZnO nanorods due to Sb doping _________________ _

If you would like training on the HD-2700 and have a GTLogin; click HERE and click on the request training button.

If you do not have a GTLogin click HERE.

Key parameters
  • Image resolution 0.136 nm HAADF-STEM / 0.105 nm FFT 8 million X
  • Magnification 100X – 10,000,000X
  • Acceleration Voltage 80, 120, and 200KV

 

Useful Files: