AFM
Atomic Force Microscopy
Scanning Probe Microscopy

Atomic Force Microscopy

Bruker Dimension Icon Scanning Probe Microscopy
Performs all major SPM imaging like…

  • Peak Force Tapping
  • Contact Mode
  • Lateral Force Mode (LFM)
  • Electric Force Mode (EFM)
  • Magnetic Force Mode (MFM)
  • Fluid Imaging
  • Kelvin Probe Microscopy (KPFM)
  • Phase Imaging
  • Lift Mode
  • Force Spectroscopy
  • Force Volume
  • Surface Potential
  • Torsional Resonance (TR) Mode
  • Piezoresponse Microscopy

Samples up to 210 mm in dia/ 15 mm thick; Vertical range (Z) upto 13 microns; X,Y scan range -90 x 90 microns

Special Features

    • Can measure ultra low current between probe tip and sample using PeakForce TUNA Mode.
    • Can measure variation in conductivity and locate electrical defects of conductive samples using CAFM Mode.
    • New DataCube TUNA & SCM Modes provide Nanoelectrical & Nanomechanical spectra at every point.
    • Force Volume & Scan Asyst Probe Capabilities with user friendly software.