On Thursday and Friday, December 2nd & 3rd, the MCF in coordination with the IEN is hosting two days of measurement and characterization in the Pettit Microelectronics Building.
We plan to highlight previously available and new capabilities added over the last year for 2D, 3D, x-ray, and elemental measurements.
Please bring samples you are interested in measuring and staff will be happy to help you.
Download the flyer below, and we hope to see you there!
Where: Pettit 160
When: December 2nd & 3rd | 10:00AM – 5:00 PM
If you have questions or concerns, please feel free to contact the MCF Staff:
Pettit MCF Demo Day Advert Dec 2021
After a hiatus, the quarterly MCF Image Contest is back and the Fall 2021 submissions can be submitted here! Three quarterly winners of the contest will each receive 5 free hours on the characterization tool of their choosing and be entered into a semi-annual Grand Prize selection for cash prizes of $60 for First Prize and $30 for each of the two Second Prize winners.
Previous entries can be seen here!
If you are uncertain as to the rules of the submission process, those can be reviewed here.
We recently purchased an in situ heating holder from Hitachi and installed it in the aberration corrected STEM Hitachi HD2700. The heating temperature can increase up to 1200C. The in situ heating experiments performed in the aberration corrected STEM can allow you to directly observe the phase transformation, nanoparticle crystallization and growth, atomic cluster or single atom rippening, phase segregation, elemental homogenization, and many others at atomic scale. Currently we hold two types of heating chips w/ or w/o hole in thin SiNx membrane. But the hitachi company offer many selections of heating chips available to buy in small quantity i.e. 5/pk.
If you need to know anything more about the heating experiment or training in the STEM, please contact Mengkun Tian.