Join us Tuesday, March 29, for a free atomic force microscopy (AFM), nanoscale infrared (AFM-IR) spectroscopy, and nanoindentation workshop at the Georgia Institute of Technology. During the workshop, we will explore the latest advances in AFM, BioAFM, AFM-IR, nanoindentation technologies, and perform hands-on demonstrations with Bruker’s Dimension Icon AFM.
Please register for our workshop at this link!
If you would like to download the flyer, you can do so here.
