Bruker Dimension ICON AFM

Bruker Dimension Icon Scanning Probe Microscopy

Hitachi HD-2700 STEM

Peak Force Tapping
Contact Mode
Electric Force Mode (EFM)
Magnetic Force Mode (MFM)
Fluid Imaging
Kelvin Probe Microscopy (KPFM)
Force Volume Spectroscopy
Piezo response Microscopy (PFM)
Conductive AFM (CAFM)
Peak Force TUNA
Peak Force QNM

Special Features
-Samples upto 20 mm thick; Vertical range (Z) upto 13.5 microns; X-Y scan range upto 90 x 90 microns
-Can measure ultra low current (fA to micro Amps)between probe tip and sample using PeakForce TUNA Mode.
-Can measure variation in conductivity and locate electrical defects of conductive samples using CAFM Mode.
-New DataCube TUNA & SCM Modes provide Nanoelectrical & Nanomechanical spectra at every point based on Fast Force Volume.
-Fast Force Mapping Capabilities.
-Quantitative Nanomechanical Property Imaging with PF QNM.
-Scan Asyst Probe Capabilities with user friendly software.

To reserve time or request training on this tool, click here or on the image at the left to go to the AFM tool page on SUMS.

Probe Holders :

  The AFM system has a variety of probe holders to do advanced SPM

   -Standard:  Supports contact mode, tapping mode, phase imaging, EFM, PFM
  -Nonmagnetic:  Supports MFM in addition to above modes; Cu-alloy clip
  -Fluid:  Supports contact mode, tapping mode, phase imaging in aqueous media and other     fluids
  -cAFM:  Supports contact mode and conductive AFM
  -SCM:   Scanning Capacitance Measurements
  -PF TUNA:  To measure current between tip and surface

AFM new software instructions
AFM Overview

Links to Training Videos :

Bruker Website Links :