On Thursday and Friday, December 2nd & 3rd, the MCF in coordination with the IEN is hosting two days of measurement and characterization in the Pettit Microelectronics Building.
We plan to highlight previously available and new capabilities added over the last year for 2D, 3D, x-ray, and elemental measurements.
Please bring samples you are interested in measuring and staff will be happy to help you.
Download the flyer below, and we hope to see you there!
Where: Pettit 160
When: December 2nd & 3rd | 10:00AM – 5:00 PM
If you have questions or concerns, please feel free to contact the MCF Staff: