Category: Training

MCF Lecture Series – Scanning Transmission Electron Microscopy – Technology and Applications 

MCF Technical Lecture Series: 

  • Thursday, December 14th 12:00 – 1:30 (NOTE TIME CORRECTION!)
  • Paper Tricentennial Building Seminar Hall – Room 114
  • Pizza and Drinks will be served 

Scanning Transmission Electron Microscopy – Technology and Applications 

C.T. (Tom) Schamp, Ph.D. 

Principal Consulting Scientist 

Materials Analytical Services, LLC 

Suwanee, GA 

 

The Scanning Transmission Electron Microscope (STEM) has evolved from a niche research-lab apparatus to arguably the leading electron microscopy analysis technique humanity has devised. In this presentation, I will discuss general principals of the STEM and aberration correction with an emphasis on making the concepts readily accessible. Then I will discuss examples of how the STEM is being or has been used to obtain data from nearly every conceivable signal available, including three-dimensional data.  

 

 

 

Crystalmaker Software Suite

The MCF has acquired a site license for Georgia Tech for the Crystalmaker Software Suite (Crystalmaker, CrystalDiffract, and Single Crystal) for mac and windows. This is a powerful software package that allows you to create CIF patterns of materials as well as nice images of your crystals for presentations/publications.

If you aren’t familiar with it, more information can be found here:

http://www.crystalmaker.com/

We are going to be hosting it on the OIT website in the near future, but if you would like to get your new licenses for next year or get a copy of it before we host it there, please contact me.

-David-

Webinar on Powder Diffraction by Malvern PANalytical

Introduction to Practical X-ray Powder Diffractometry

This presentation teaches the basic principles of X-ray diffraction and what information can be learned from an X-ray diffraction pattern. This presentation does not delve deeply into the mathematics or physics of diffraction, but rather focuses on illustrating the power of this materials analysis technique. It is intended for a broad audience—technicians, managers, students, professor moving from single crystal diffractometry into powder diffractometry, and those who are considering if X-ray diffraction could be a beneficial addition to their lab.

X-Ray Powder Diffraction is most often used to answer the questions: what is in the sample and how much? With modern diffractometers, it is possible to load a sample, push a single button, and get an answer. But … where did that answer come from? How reliable is it? What other information might be available in the data? This talk will dissect the X-ray powder diffraction pattern and show the wealth of information contained within.

More information can be found here.

Malvern PANalytical Aeris in the XRD Lab

Malvern PANalytical has graciously housed the Aeris, their new benchtop XRD in the lab across from the Alpha-1. The Aeris is a easy to use XRD designed to run powder/pellet samples. This tool is free to use, and if you would like to get trained on it see how it runs your samples, please contact David Tavakoli (david.tavakoli@mse.gatech.edu) Tuesday or Wednesday of this week. Unfortunately on Thursday it will be shipped out to another lab.

For more details on the Aeris, please go here.

 

Practical Surface Characterization of Materials: An Interactive Short Course on XPS, UPS and SIMS

A two day short course on surface characterization will be held on the Georgia Tech Campus from Thursday, August 17th to Friday, August 18th.

Course details/ summary –  A detailed introduction to the principles and practice of two techniques for analyzing the first few monolayers of a surface: XPS -the most common surface analytical method and ToF-SIMS a mass-spectroscopy-based method complementary in many ways to XPS.  Taken together they allow:

  • The detection of the elemental composition of a sample
  • The detection of even trace elements down to ppm of a monolayer
  • The chemical bonding between elements
  • The lateral and vertical distribution of elements in the top layers of a sample
  • The surface bonding and band structure of compounds including work function and band occupancy

More details and registration can be found here.

in-situ TEM workshop between March 21-23, 2017

Gatan company and DENS Solutions will give an in-situ TEM workshop at Georgia Tech between March 21-23, 2017.

The workshop includes:

March 21: presentations in the morning – 2 from Gatan, and 2-3 from GA Tech, then an afternoon of demos on the instrument of known samples open to all attendees.

March 22-23: specific GA Tech samples

The information about the in-situ heating TEM holder and Nano-chip sample preparation can be find here.