Malvern PANalytical Aeris in the XRD Lab

Malvern PANalytical has graciously housed the Aeris, their new benchtop XRD in the lab across from the Alpha-1. The Aeris is a easy to use XRD designed to run powder/pellet samples. This tool is free to use, and if you would like to get trained on it see how it runs your samples, please contact David Tavakoli ( Tuesday or Wednesday of this week. Unfortunately on Thursday it will be shipped out to another lab.

For more details on the Aeris, please go here.


Practical Surface Characterization of Materials: An Interactive Short Course on XPS, UPS and SIMS

A two day short course on surface characterization will be held on the Georgia Tech Campus from Thursday, August 17th to Friday, August 18th.

Course details/ summary –  A detailed introduction to the principles and practice of two techniques for analyzing the first few monolayers of a surface: XPS -the most common surface analytical method and ToF-SIMS a mass-spectroscopy-based method complementary in many ways to XPS.  Taken together they allow:

  • The detection of the elemental composition of a sample
  • The detection of even trace elements down to ppm of a monolayer
  • The chemical bonding between elements
  • The lateral and vertical distribution of elements in the top layers of a sample
  • The surface bonding and band structure of compounds including work function and band occupancy

More details and registration can be found here.

in-situ TEM workshop between March 21-23, 2017

Gatan company and DENS Solutions will give an in-situ TEM workshop at Georgia Tech between March 21-23, 2017.

The workshop includes:

March 21: presentations in the morning – 2 from Gatan, and 2-3 from GA Tech, then an afternoon of demos on the instrument of known samples open to all attendees.

March 22-23: specific GA Tech samples

The information about the in-situ heating TEM holder and Nano-chip sample preparation can be find here.