The tools and staff members in the MCF can analyze samples in multiple different ways from the macro level to the atomic level. Here is a sampling of what we can help you to discover.
| Size | Shape | Elemental Composition | Chemical Composition | Structure |
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Techniques Available
Probe-based Techniques
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Electron/Ion-based Techniques
Photon-(including x-ray)-based Techniques
AFM
Atomic Force Microscopy
cAFM
conductive AFM
CSM
Continuous Stiffness Measurement
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DMA
Dynamic Materials Analysis
EBSD
Electron BackScatter Diffraction
EDS
Energy Dispersive Spectroscopy
FIB
Focused Ion Beam micro-machining
FTIR
Fourier Transfer InfraRed spectroscopy
MFM
Magnetic Force Microscopy
PFM
Piezoresponse Force Microscopy
Raman
Raman spectroscopy
SAXS
Small Angle X-ray Scattering
SEM
Scanning Electron Microscopy
STM
Scanning Tunneling Microscopy
(S)TEM
(Scanning) Transmission Electron Microscopy
ToF-SIMS
Time-of-Flight Secondary Ion Mass Spectroscopy
UPS
Ultraviolet Photoelectron Spectroscopy
XPS
X-Ray Photoelectron Spectroscopy
XRD
X–Ray Diffraction
