The tools and staff members in the MCF can analyze samples in multiple different ways from the macro level to the atomic level.  Here is a sampling of what we can help you to discover.

Size Shape  Elemental Composition Chemical Composition Structure
Created by Digital Micrograph, Gatan Inc.  Jamey Gigliotti_ZnO NW Sphere-J_Gigliotti 10-22-15 Composite  OLED DepProf by Ar GCIS Created by Digital Micrograph, Gatan Inc.

Techniques Available

Scanning Probe-based Techniques
__ Electron/Ion-based Techniques
Photon-(including x-ray)-based Techniques
Molecular Property (e.g., size, mass, thermal) Measurement  Techniques
Mechanical Property Measurements

AFM Atomic Force Microscopy
_FM Analytical AFM modes (e.g., cAFM, EFM, KPFM, PFM, MFM, etc.)
CSM a.k.a DMA
Continuous Stiffness Measurement a.k.a Dynamic Mechanical Analysis
DSC Differential Scanning Calorimetry
EBSD Electron BackScatter Diffraction
EDS Energy Dispersive Spectroscopy
FIB Focused Ion Beam micro-machining
FTIR Fourier Transform InfraRed spectroscopy
GC/ & LC/MS Gas Chromatography & Liquid Chromatography/ Mass Spectroscopy
GPC Gel Permeation Chromatography
Instron & MTS frames Electromechanical & Servohydraulic test frames for mechanical (e.g., tensile, compressive, torsional, creep, fatigue, fracture, etc.) testing
LIBS / OES Laser-Induced Breakdown Spectroscopy / Optical Emission Spectroscopy
Nanoindentation Nanoscale mechanical property measurement (e.g., hardness, modulus, etc.)
PL PhotoLuminescence
Raman Raman spectroscopy
SAXS Small Angle X-ray Scattering
SEM Scanning Electron Microscopy
STM/S Scanning Tunneling Microscopy/ Spectroscopy
(S)TEM (Scanning) Transmission Electron Microscopy
Time-of-Flight Secondary Ion Mass Spectroscopy
TGA Thermo-Gravimetric Analysis
UPS Ultraviolet Photoelectron Spectroscopy
UV-Vis/NIR UltraViolet-Visible / Near InfraRed Spectrophotometry
XAS X-Ray Absorption Spectroscopy (e.g., XAFS, NEXAFS)
XES X-Ray Emission Spectroscopy
XPS X-Ray Photoelectron Spectroscopy
XRD XRay Diffraction
XRF X-Ray Fluorescence (coming soon)