The tools and staff members in the MCF can analyze samples in multiple different ways from the macro level to the atomic level. Here is a sampling of what we can help you to discover.
| Size |
Shape |
Elemental Composition |
Chemical Composition |
Structure |
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Techniques Available
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Scanning Probe-based Techniques |
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Electron/Ion-based Techniques |
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Photon-(including x-ray)-based Techniques |
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Molecular Property (e.g., size, mass, thermal) Measurement Techniques |
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Mechanical Property Measurements |
| AFM |
Atomic Force Microscopy |
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| _FM |
Analytical AFM modes (e.g., cAFM, EFM, KPFM, PFM, MFM, etc.)
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PL |
PhotoLuminescence |
| CL |
CathodoLuminescence (coming soon) |
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Raman |
Raman spectroscopy |
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CSM a.k.a
DMA
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Continuous Stiffness Measurement a.k.a Dynamic Mechanical Analysis
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REELS |
Reflected Electron Energy Loss Spectroscopy |
| DSC |
Differential Scanning Calorimetry |
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SAXS |
Small Angle X-ray Scattering |
| EBSD |
Electron BackScatter Diffraction |
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SEM |
Scanning Electron Microscopy |
| EDS |
Energy Dispersive Spectroscopy |
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STM/S |
Scanning Tunneling Microscopy/ Spectroscopy |
| FIB |
Focused Ion Beam micro-machining |
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(S)TEM |
(Scanning) Transmission Electron Microscopy |
| FTIR |
Fourier Transform InfraRed spectroscopy |
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ToF-SIMS |
Time-of-Flight Secondary Ion Mass Spectroscopy |
| GC- & LC- MS |
Gas Chromatography & Liquid Chromatography- Mass Spectroscopy |
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TGA |
Thermo-Gravimetric Analysis |
| GPC |
Gel Permeation Chromatography |
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UPS |
Ultraviolet Photoelectron Spectroscopy |
| ICP-MS |
Inductively Coupled Plasma – Mass Spectroscopy |
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UV.Vis/NIR |
UltraViolet-Visible / Near InfraRed.Spectrophotometry |
| Instron & MTS frames |
Electromechanical & Servohydraulic test frames for mechanical (e.g., tensile, torsional, creep, fatigue, fracture, etc.) testing |
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XAS |
X-Ray Absorption Spectroscopy (e.g., XAFS, NEXAFS) |
| ISS |
Ion Scattering Spectroscopy (coming soon) |
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XES |
X-Ray Emission Spectroscopy |
| LIBS / OES |
Laser-Induced Breakdown Spectroscopy / Optical Emission Spectroscopy |
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XPS |
X–Ray Photoelectron Spectroscopy |
| Nanoindentation |
Nanoscale mechanical property measurement (e.g., hardness & modulus) |
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XRD |
X–Ray Diffraction |
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XRF |
X–Ray Fluorescence |
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