The tools and staff members in the MCF can analyze samples in multiple different ways from the macro level to the atomic level. Here is a sampling of what we can help you to discover.
| Size | Shape | Elemental Composition | Chemical Composition | Structure |
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Techniques Available
Scanning Probe-based Techniques
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Electron/Ion-based Techniques
Photon-(including x-ray)-based Techniques
Molecular Property (e.g., size, mass, thermal) Measurement Techniques
Mechanical Property Measurements
AFM
Atomic Force Microscopy
_FM
Analytical AFM modes (e.g., cAFM, EFM, KPFM, PFM, MFM, etc.)
CSM a.k.a DMA
Continuous Stiffness Measurement a.k.a Dynamic Mechanical Analysis
DSC
Differential Scanning Calorimetry
EBSD
Electron BackScatter Diffraction
EDS
Energy Dispersive Spectroscopy
FIB
Focused Ion Beam micro-machining
FTIR
Fourier Transform InfraRed spectroscopy
GC/ & LC/MS
Gas Chromatography & Liquid Chromatography/ Mass Spectroscopy
GPC
Gel Permeation Chromatography
Instron & MTS frames
Electromechanical & Servohydraulic test frames for mechanical (e.g., tensile, compressive, torsional, creep, fatigue, fracture, etc.) testing
LIBS / OES
Laser-Induced Breakdown Spectroscopy / Optical Emission Spectroscopy
Nanoindentation
Nanoscale mechanical property measurement (e.g., hardness, modulus, etc.)
PL
PhotoLuminescence
Raman
Raman spectroscopy
SAXS
Small Angle X-ray Scattering
SEM
Scanning Electron Microscopy
STM/S
Scanning Tunneling Microscopy/ Spectroscopy
(S)TEM
(Scanning) Transmission Electron Microscopy
ToF-SIMS
Time-of-Flight Secondary Ion Mass Spectroscopy
TGA
Thermo-Gravimetric Analysis
UPS
Ultraviolet Photoelectron Spectroscopy
UV-Vis/NIR
UltraViolet-Visible / Near InfraRed Spectrophotometry
XAS
X-Ray Absorption Spectroscopy (e.g., XAFS, NEXAFS)
XES
X-Ray Emission Spectroscopy
XPS
X-Ray Photoelectron Spectroscopy
XRD
X–Ray Diffraction
XRF
X-Ray Fluorescence (coming soon)