Renishaw Webinar on Particle Size Determination

The New Raman Renishaw Particle Analysis Software – Targeted Raman Data Collection

Wednesday, September 30th – 2:00pm (EST)

Renishaw’s upcoming Particle Analysis software enables targeted Raman data collection from optical image contrast. This approach ensures data is only collected from the areas of interest, making it a fast and automated method.

In this webinar, we will show how the diverse high performing optical contrast methods of the inVia Raman microscope can be used to quickly, easily, and automatically report particle identities and morphology together. Applied to a diverse range of applications, from microplastics to materials and forensics to pharmaceuticals, see how Particle Analysis can benefit your work.

This webinar will be broadcast in the MCF Lobby in the Marcus Nanotechnology Building.

Register for it here!

 

MCF is extending its Raman and PL capabilities to Deep UV with a new stand alone Renishaw system

  • Extremely high efficiency 250 mm focal length inVia Reflex spectrograph
  • Stand alone Renishaw Raman unit with solid-state Deep-UV laser (266 nm) and components
  • UV optics for high temperature and high power electronics.
  • Capability for Raman and PL spectroscopy from 200 nm – 1700 nm with automated mapping.
  • Andor InGaAs detector.
  • Ability to measure spectra of photonic materials deep into the UV range (e.g. AlxGa1-xN with up to 75% Al) including materials of Ultra-Wide Bandgap Initiatives.
  • Confocal Raman measurements with different Bright Field objective options
  • Different Grating options include 600 l/mm (NIR) & 3600 I/mm(UV)