Hello MCF in collaboration with Thermo will be hosting a workshop on ICP this coming July 24 in the Marcus Nanotechnology Building in the seminar room 1116-1118. This will be a detailed workshop on best practices, recommendations, tips and tricks, and you will be able to ask questions directly to application engineers.
Please register here and lunch will be provided
https://gatech.co1.qualtrics.com/jfe/form/SV_8G5ZQTGuq6sZ674
The Materials Characterization Facility hosts a running image contest that resets bimonthly. The current image contests will run through June 30, 2024. In addition to displaying some of the imaging and analysis capabilities of our labs, it gives our users a chance to display their creative side. Check back here the first week of each month for updates on submission and in June we will announce our annual winners.
To submit your images, please go here!
https://gatech.infoready4.com/#competitionDetail/1934698
More information on the contest, rules, and how to make submissions can be found here
Example of Previous Submissions and Winners
As part of our ongoing efforts to provide users continued support for their research, the MCF is partnering with Thermo Scientific to host a 2-day workshop on electron-based surface science methods (XPS, UPS, REELS, etc.).
The Workshop will be Wed. & Thurs. May 8th & 9th and will include lunch. We will have internal and external speakers as well as a hands-on guided session for XPS data analysis using Thermo’s Avantage software.
Please take a look at the attached flyer and sign up as soon as possible to ensure your spot. Feel free to contact MCF Staff with any questions. To register you can go here or https://rb.gy/cf8yx7
The Materials Characterization Facility hosts a running image contest that resets bimonthly. The current image contests will run through March 31, 2024. In addition to displaying some of the imaging and analysis capabilities of our labs, it gives our users a chance to display their creative side. Check back here the first week of each month for updates on submission and in June we will announce our annual winners.
To submit your images, please go here!
https://gatech.infoready4.com/#competitionDetail/1925070
More information on the contest, rules, and how to make submissions can be found below
The MCF hosts a running image contest that resets bimonthly. The current image contests will run through November 30, 2023. In addition to displaying some of the imaging and analysis capabilities of our labs, it gives our users a chance to display their creative side. Check back here the first week of each month for updates onsubmission and twice a year – around mid-January and mid-June – to see the semiannual grand prize winners.
To submit an image, you can do so here.
https://gatech.infoready4.com/#competitionDetail/1917243
If you are an MCF user, then check out the contest rules here and please consider submitting.
The Materials Characterization Facility (MCF) is pleased to announce that in January, in collaboration with Rigaku, we will be hosting a workshop on X-ray Diffraction. January 5th will feature seminars from researchers and faculty at Georgia Tech and across the southeast including but not limited to Clemson, Emory, Florida State University, and JSNN. January 6th will feature hands on training and application of techniques and showing off the capabilities of the tools and the software.
Registration information will be posted on the MCF (mcf.gatech.edu) website as well on the Rigaku website.
https://events.rigaku.com/symposium-gt-2023/registration
We look forward to seeing you at our workshop in the New Year!
Bruker will be hosting a webinar on quantitative XRF this coming Tuesday. The MCF will be playing the webinar in the lobby of Characterization Facility in Marcus.
In this webinar, Bruker will present potentials for quantification from simple to complex specimens, from infinitely thick to thin, from ideal to non-ideal samples. The possibilities to optimize the analytical output will be elaborated on using example cases. A discussion on detection limits and develop potential improvements and parameter optimization will also be had.
If you would like to register to watch it at your own concenience, you can sign up for it here.
The MCF is pleased to announce the installation of its latest X-Ray tool, the Bruker Tornado X–Ray Fluorescence (XRF) spectrometer. Featuring two sources, two detectors, and an automatic stage with micron-level positioning accuracy; the XRF is capable of measuring elements from C to U with a spot size down to 20um for high resolution elemental mapping of materials and devices.
In addition, advanced software packages: XMethod – for layer thickness calculation and AMICS – for automated mineral determination are available to users for sample analysis.
More information about the instrument and its capabilities will be updated on its webpage.
The tool is currently available for use and is available for requests for training on SUMS.
If you have questions about its capabilities please contact David Tavakoli: atavakoli6@gatech.edu
Demonstrations this Friday, August 12, 3:00-6:00PM
The benchtop XRD from Rigaku is now available for use in the MCF and is on SUMS! More information about the instrument can be found here! This Friday, August 12, from 3:00-6:00, David Tavakoli will be demonstrating the capabilities of the newest XRD on campus. If you have samples you would like to try or are curious and want to know more, please make an appointment.
As part of it’s ongoing expansion of materials analysis capabilities, the IEN / IMat Materials Charcterization Facility is finalizing plans to house a new ICP-MS instrument.
The planned vendor of this instrument, Thermo Fisher Scientific, is giving a talk on its capabilities and applications Thursday, October 28th at 1:00 in conference room 1116 in the Marcus Nanotechnology building.
Any user generally interested in this technique and/or specifically in need of mass-spectroscopy chemical analysis is encouraged to attend.
See the attached flyer for details, please forward to any interested colleagues, and let the MCF staff know if you have any questions.
Regards,
Walter Henderson