Scanning Electron Microscopy (SEM)

The MCF has 5 SEM’s.  Four of them (the FEI Nova, LEO1530, Hitachi SU8230 and Zeiss Ultra 60) are equipped with EDS, which can perform elemental analysis on samples.

The Thermo Helios 5CX  FIB/SEM has an easy-lift manipulator on it to allow TEM lamella preparation and liftout.

The LEO 1530 and Hitachi SU8010 are located in the Paper Tricentennial Building (formerly the IPST) basement, while the others are in the Marcus Nanotechnology Building basement in the Materials Characterization Facility..