Chemical Analysis of Solids and Powders
The energies of those electrons are characteristic of the elements from which they came and the specific chemical bonds that involve those elements.
By plotting the number of photoelectrons as a function of energy, one can obtain detailed information on the near-surface elemental and chemical composition of a sample.
To reserve time or request training on this tool, click here or on the image at left to go to the K-alpha XPS tool page on SUMS.
|Deconvolution of Carbon spectrum in a graphene oxide film on SiC shows XPS ability to distinguish chemical states.||Nitrogen-rich areas -in Red on map above – show amine-terminated spots on a Ti layer. The map is overlaid on an optical image of the sample.||An integrated Ar sputter gun allows in-situ sample cleaning and depth profiles like the one above on a multi-layer PZT film.|
Several analysis techniques provide information about elemental composition (XRF, EDS, SIMS, etc.). For inorganic compounds that information is usually enough to determine a sample’s chemical makeup. However, for organic compounds, there are typically numerous chemical permutations even within the constraints of a given composition.
Only a few techniques provide direct evidence of the chemical state of an element. Among them, XPS is unique in it’s surface sensitivity, which makes it an ideal way to study – among other materials – (catalysts, ion-exchange membranes, graphene and other low-dimensional structures, functionalized CNT’s, metal corrosion, etc.) Sources: Capabilities: Single-point spectra; Line profiles; Area Chemical Maps; Depth Profiles Files:
Capabilities: Single-point spectra; Line profiles; Area Chemical Maps; Depth Profiles