The Bruker Tornado X-Ray Fluorescence (XRF) spectrometer is now in the MCF. Featuring two sources (Rhodium and Tungsten), two detectors, and an automatic stage with micron-level positioning accuracy; the XRF is capable of measuring elements from C to U with a spot size down to 20um for high resolution elemental mapping of materials and devices.
In addition, advanced software packages: XMethod – for layer thickness calculation and AMICS – for automated mineral determination are available to users for sample analysis.
More information about the instrument and its capabilities will be posted on this page over time.
To reserve the tool in SUMS, or to request training, please go here.