David Tavakoli

X-Ray Fluorescence (XRF) at the MCF

The MCF is pleased to announce the installation of its latest X-Ray tool, the Bruker Tornado X–Ray Fluorescence (XRF) spectrometer. Featuring two sources, two detectors, and an automatic stage with micron-level positioning accuracy; the XRF is capable of measuring elements from C to U with a spot size down to 20um for high resolution elemental mapping of materials and devices.

In addition, advanced software packages: XMethod – for layer thickness calculation and AMICS – for automated mineral determination are available to users for sample analysis.

More information about the instrument and its capabilities will be updated on its webpage.

The tool is currently available for use and is available for requests for training on SUMS.

If you have questions about its capabilities please contact David Tavakoli: atavakoli6@gatech.edu

New Rigaku Miniflex in the MCF

Demonstrations this Friday, August 12, 3:00-6:00PM

The benchtop XRD from Rigaku is now available for use in the MCF and is on SUMS! More information about the instrument can be found here! This Friday, August 12, from 3:00-6:00, David Tavakoli will be demonstrating the capabilities of the newest XRD on campus. If you have samples you would like to try or are curious and want to know more, please make an appointment.

AFM Workshop with Bruker, March 29th!

Join us Tuesday, March 29, for a free atomic force microscopy (AFM), nanoscale infrared (AFM-IR) spectroscopy, and nanoindentation workshop at the Georgia Institute of Technology. During the workshop, we will explore the latest advances in AFM, BioAFM, AFM-IR, nanoindentation technologies, and perform hands-on demonstrations with Bruker’s Dimension Icon AFM.

Please register for our workshop at this link!

If you would like to download the flyer, you can do so here.

XRDs moving on March 6-March11, 2022

Hello everyone,

Our current set of XRD instruments, while capable and well-maintained, are beyond their design lifetime and – save for the Empyrean – are no longer supported by the OEM. At the same time, we have had extensive conversations with faculty on campus who want to do more advanced XRD measurements than our current tools will support.

To address both issues: We have some big news to share. With the financial and technical support of the EVPR and Prof. M. Mourigal, the MCF is acquiring three new XRD systems from Rigaku to be housed in the Marcus Microanalysis lab in the MCF. This acquisition will add or extend capabilities for:

Cryo measurements (down to LHe temps)
PDF measurements
Auto-samplers for multi-sample measurements.

Though there will be a learning curve for the new data analysis SW, researchers will be able to do that analysis on their own computers instead of having to use the one central system in the MCF lab.

Not to bury the lede, but to prepare for the installation of the the XRDs, the existing PANalytical instruments will be moving to the Paper Tricentennial Building the week of March 6th. We anticipate that they will be down from March 6 to March 10, and should be available for use by Monday, March 13th. Please plan to complete your XRD work by Sunday, March 5th.

There will be a transition of MCF support from the Panalytical systems to the Rigaku systems over the rest of calendar year 2022, but there should always be an operational PXRD and single-crystal system available in the MCF.

We want to stress that we are not losing any currently available capabilities and are adding several advanced measurement modes. The new instruments give us flexibility to augment with additional capabilities over time.

Please contact David Tavakoli or another member of the MCF staff if you have any questions or concerns.

The MCF has acquired the new codes for the Crystalmaker Software suite and it is available for download for students and staff at Georgia Tech! The crystalmaker suite will enable you to create crystal models, simulate XRD patterns, and generate CIFs. For the codes, please contact David Tavakoli (david.tavakoli@mse.gatech.edu) from a GT email address. The codes will also be available from OIT in the new year.

More information can be found here.

Measurement & Characterization December Demo Days in Pettit 160

On Thursday and Friday, December 2nd & 3rd, the MCF in coordination with the IEN is hosting two days of measurement and characterization in the Pettit Microelectronics Building.

We plan to highlight previously available and new capabilities added over the last year for 2D, 3D, x-ray, and elemental measurements.

Please bring samples you are interested in measuring and staff will be happy to help you.

Download the flyer below, and we hope to see you there!

Where: Pettit 160
When: December 2nd & 3rd | 10:00AM – 5:00 PM

If you have questions or concerns, please feel free to contact the MCF Staff:

atavakoli6@gatech.edu, 770-689-6840

Pettit MCF Demo Day Advert Dec 2021

Fall 2021 Image Contest is now live!

After a hiatus, the quarterly MCF Image Contest is back and the Fall 2021 submissions can be submitted here! Three quarterly winners of the contest will each receive 5 free hours on the characterization tool of their choosing and be entered into a semi-annual Grand Prize selection for cash prizes of $60 for First Prize and $30 for each of the two Second Prize winners.

Previous entries can be seen here!

If you are uncertain as to the rules of the submission process, those can be reviewed here.

New Crystalmaker Software Suite for 2021

The Crystalmaker Software suite is available for download for students and staff at Georgia Tech! The crystalmaker suite will enable you to create crystal models, simulate XRD patterns, and generate CIFs. For the codes, please contact David Tavakoli (david.tavakoli@mse.gatech.edu) from a GT email address.

Renishaw Webinar on Particle Size Determination

The New Raman Renishaw Particle Analysis Software – Targeted Raman Data Collection

Wednesday, September 30th – 2:00pm (EST)

Renishaw’s upcoming Particle Analysis software enables targeted Raman data collection from optical image contrast. This approach ensures data is only collected from the areas of interest, making it a fast and automated method.

In this webinar, we will show how the diverse high performing optical contrast methods of the inVia Raman microscope can be used to quickly, easily, and automatically report particle identities and morphology together. Applied to a diverse range of applications, from microplastics to materials and forensics to pharmaceuticals, see how Particle Analysis can benefit your work.

This webinar will be broadcast in the MCF Lobby in the Marcus Nanotechnology Building.

AVS Webinar: Surface Characterization of Biomaterials with X-rays and Ion Guns

Surfaces play an important role in almost all aspects of our lives. For example, biosensors that are used to detect and identify diseases are often based on chemical surface modifications. The interaction of small molecules or nanoparticles with surfaces such as lung tissue is also often dictated by surface chemistry. This means that it is critical to know as much as possible about a surface in order to both understand the interactions that occur and to be able to design surfaces that promote successful interactions.

This webinar is intended for researchers, students, technologists and others involved in research with biomaterial and biological surfaces who are looking to gain an understanding or broaden their knowledge on how XPS and ToF-SIMS can help in characterizing biological and biomaterial surfaces and interactions. The course will be beneficial to a large audience, from young scientists to engineers, as various aspects from instrumentation through best practices for sample handling, data collection and data analysis will be discussed in the context of characterizing organic materials with XPS and ToF-SIMS.

The deadline for registration for this workshop is Sept 11, 2020 and you can register for it here.

IMS Materials Characterization Facility

Author: David Tavakoli