We will be presenting a Webinar about XRF (X-ray fluorescence) from Bruker on the large monitor in Marcus on July 14th at 10:00AM.
XRF is a non-destructive analytical technique used to determine the elemental composition of materials. XRF analyzers determine the chemistry of a sample by measuring the fluorescent (or secondary) X-ray emitted from a sample when it is excited by a primary X-ray source.
The webinar will describe how the M4 TORNADO can be used to identify high and low angle grain boundaries as well as twin boundaries in crystalline materials. From polycrystalline silicon wafers to aluminum samples and welding joint, the method presented in this webinar allows the user to obtain information on the crystals such as size and distribution.
More information can be found here.
If XRF is a technique that your research group is particularly interested in, please contact me at david.tavakoli at mse.gatech.edu.
