AFM
Atomic Force Microscopy
Scanning Probe Microscopy
Brand New AFM at MCF!

Brand New AFM at MCF!

The MCF is getting a new AFM the first week of June 2019 !

 

Bruker Dimension Icon Scanning Probe Microscopy

Performs all major SPM imaging like…

  • Peak Force Tapping
  • Contact Mode
  • Lateral Force Mode (LFM)
  • Electric Force Mode (EFM)
  • Magnetic Force Mode (MFM)
  • Fluid Imaging
  • Kelvin Probe Microscopy (KPFM)
  • Phase Imaging
  • Lift Mode
  • Force Spectroscopy
  • Force Volume
  • Surface Potential
  • Torsional Resonance (TR) Mode
  • Piezoresponse Microscopy

Samples up to 210 mm in dia/ 15 mm thick

Vertical range (Z) upto 10 microns

X,Y scan range ; 90 x 90 microns

Special Features

  • Can measure ultra low current between probe tip and sample using PeakForce TUNA Mode.
  • Torsional Resonance feedback can be enabled on soft samples using TR TUNA Mode.
  • Can measure variation in conductivity and locate electrical defects of conductive samples using CAFM Mode.
  • New DataCube TUNA & SCM Modes provide Nanoelectrical & Nanomechanical spectra at every point based on Fast Force Volume.
  • Fast Force Mapping Capabilities.
  • Scan Asyst Probe Capabilities with user friendly software.
  • Fully flexible SPM with easily accessible features.