Brand New AFM at MCF!

The MCF is getting a new AFM the first week of June 2019 !

 

Bruker Dimension Icon Scanning Probe Microscopy

Performs all major SPM imaging like…

  • Peak Force Tapping
  • Contact Mode
  • Lateral Force Mode (LFM)
  • Electric Force Mode (EFM)
  • Magnetic Force Mode (MFM)
  • Fluid Imaging
  • Kelvin Probe Microscopy (KPFM)
  • Phase Imaging
  • Lift Mode
  • Force Spectroscopy
  • Force Volume
  • Surface Potential
  • Torsional Resonance (TR) Mode
  • Piezoresponse Microscopy

Samples up to 210 mm in dia/ 15 mm thick

Vertical range (Z) upto 10 microns

X,Y scan range ; 90 x 90 microns

Special Features

  • Can measure ultra low current between probe tip and sample using PeakForce TUNA Mode.
  • Torsional Resonance feedback can be enabled on soft samples using TR TUNA Mode.
  • Can measure variation in conductivity and locate electrical defects of conductive samples using CAFM Mode.
  • New DataCube TUNA & SCM Modes provide Nanoelectrical & Nanomechanical spectra at every point based on Fast Force Volume.
  • Fast Force Mapping Capabilities.
  • Scan Asyst Probe Capabilities with user friendly software.
  • Fully flexible SPM with easily accessible features.

MCF Image Contest!

The MCF Image Contest is still going strong! Please consider sending your images/spectra so we can highlight what you are doing to the Georgia Tech Community and beyond!

More information as to how to submit your images and our guidelines can be found here: http://mcf.gatech.edu/news/image-contest-guidelines/

To see past images that have been submitted, they can be found here: http://mcf.gatech.edu/monthly-image-contest-results/

Thank you!

-MCF Staff-