AVS Webinar: Surface Characterization of Biomaterials with X-rays and Ion Guns

Surfaces play an important role in almost all aspects of our lives.  For example, biosensors that are used to detect and identify diseases are often based on chemical surface modifications. The interaction of small molecules or nanoparticles with surfaces such as lung tissue is also often dictated by surface chemistry. This means that it is critical to know as much as possible about a surface in order to both understand the interactions that occur and to be able to design surfaces that promote successful interactions.

Who Should Attend

This webinar is intended for researchers, students, technologists and others involved in research with biomaterial and biological surfaces who are looking to gain an understanding or broaden their knowledge on how XPS and ToF-SIMS can help in characterizing biological and biomaterial surfaces and interactions. The course will be beneficial to a large audience, from young scientists to engineers, as various aspects from instrumentation through best practices for sample handling, data collection and data analysis will be discussed in the context of characterizing organic materials with XPS and ToF-SIMS.

The deadline for registration for this workshop is Sept 11, 2020 and you can register for it here.

Date: Wednesday, September 16, 2020
Time: 1:00 p.m.-5:00 p.m. EDT
Platform: Zoom

Please note this workshop is NOT free, but there is student pricing.

Practical Surface Characterization of Materials: An Interactive Short Course on XPS, UPS and SIMS

A two day short course on surface characterization will be held on the Georgia Tech Campus from Thursday, August 17th to Friday, August 18th.

Course details/ summary –  A detailed introduction to the principles and practice of two techniques for analyzing the first few monolayers of a surface: XPS -the most common surface analytical method and ToF-SIMS a mass-spectroscopy-based method complementary in many ways to XPS.  Taken together they allow:

  • The detection of the elemental composition of a sample
  • The detection of even trace elements down to ppm of a monolayer
  • The chemical bonding between elements
  • The lateral and vertical distribution of elements in the top layers of a sample
  • The surface bonding and band structure of compounds including work function and band occupancy

More details and registration can be found here.