Tag: SEM

New Image Contest Is Live!

The Materials Characterization Facility hosts a running image contest that resets bimonthly. The current image contests will run through March 31, 2024.  In addition to displaying some of the imaging and analysis capabilities of our labs, it gives our users a chance to display their creative side. Check back here the first week of each month for updates on submission and in June we will announce our annual winners.

Ag (111) surface

To submit your images, please go here!

https://gatech.infoready4.com/#competitionDetail/1925070

More information on the contest, rules, and how to make submissions can be found below

https://mcf.gatech.edu/news/

Image Contest Rules:

Example of Previous Submissions and Winners.

Measurement & Characterization December Demo Days in Pettit 160

 

On Thursday and Friday, December 2nd & 3rd, the MCF in coordination with the IEN is hosting two days of measurement and characterization in the Pettit Microelectronics Building.

We plan to highlight previously available and new capabilities added over the last year for 2D, 3D, x-ray, and elemental measurements.

Please bring samples you are interested in measuring and staff will be happy to help you.

Download the flyer below, and we hope to see you there!

Where: Pettit 160
When: December 2nd & 3rd | 10:00AM – 5:00 PM

If you have questions or concerns, please feel free to contact the MCF Staff:

atavakoli6@gatech.edu, 770-689-6840

Pettit MCF Demo Day Advert Dec 2021

September MCF Image Contest is live!

Every month the MCF hosts an image contest showing off the capabilities of our tools!

You can submit an image to be considered here!

https://gatech.infoready4.com/#competitionDetail/1795600

You can also see our previous winners here!

https://mcf.gatech.edu/monthly-image-contest-results/

Congratulations to Yung Suk “Jeremy” Yoo for his image “Jellyfish” captured on the FEI Tecnai F30 and to Alexander Terwindt for his image of a Fly Eye captured on the Hitachi 8010!

Webinar: Bringing EDS to life: sample considerations for biological element analysis – October 2nd!

Oxford Instruments webcast

 

The MCF will broadcast this webinar on the monitor in the lobby of the MCF in the Marcus Nanotechnology Building.

It will be streamed on Wednesday, October 2nd from 11:00AM-12:00PM. If you would like to watch it at your own computer, you can register for the webinar here!

—

Energy dispersive X-ray spectrometry (EDS) provides biologists with colourful element-based compositional information in addition to greyscale ultrastructural data produced with standard electron microscopy (EM), aiding the correct identification of structures and labels. A crucial aspect of all biological EM, including EDS, is the preparation of specimens with the aim of preserving and imaging samples as close to their living state as possible. The best option is freezing samples rapidly and imaging them in their frozen-hydrated state. However, the samples are sensitive to the electron beam requiring low dose imaging methods to avoid damage, and the low contrast makes identification of ultrastructure difficult. Chemical fixation allows the addition of contrasting agents and provides greater stability in samples, but prolonged preparation techniques may result in changes to ultrastructure and potential extraction of elements.

In this webcast, the speakers will discuss the challenges of biological EDS and provide information about sample preparation methods and imaging conditions in order to maximise results — from traditionally prepared samples to unstained specimens to cryo-electron microscopy of vitrified samples (CEMOVIS) — to identify and image cell ultrastructure in both transmission and scanning electron microscopy.

 

SEM and EDS Short Course

The Materials Characterization Facility (MCF) at Georgia Tech will offer a short course on “Scanning Electron Microscopy and Energy Dispersive X-ray Spectrometry (EDS)” on October 8 & 9, 2018. This 2-day short course combines lectures and laboratory, and is designed for individuals interested in hands-on training in scanning electron microscopy techniques.

This short course will cover essential signal generation and detection techniques, including secondary and backscatter electrons, X-rays, low voltage imaging, and sample preparation techniques. Attendees will learn how to adjust operating conditions to gain valuable information about material samples. This course is suitable for both new and experienced researchers.

Target Audience

Attendance is open to researchers from academia, industry and government laboratories/organizations as well as to current Georgia Tech students, IEN and MCF users. Anyone who is interested in characterization of materials is invited and strongly encouraged to participate. The concepts and techniques presented are broadly applicable to materials.

Rates (Includes Lunch)

* Georgia Tech Rate: $150

* Academic and Government Rate: $250

* Industry Rate: $500

Registration and additional details may be found here

MCF Image Contest!

The MCF Image Contest is still going strong! Please consider sending your images/spectra so we can highlight what you are doing to the Georgia Tech Community and beyond!

More information as to how to submit your images and our guidelines can be found here: https://mcf.gatech.edu/news/image-contest-guidelines/

To see past images that have been submitted, they can be found here: https://mcf.gatech.edu/monthly-image-contest-results/

Thank you!

-MCF Staff-