MCF March Image Contest!

The MCF image competition for March is now open and you can submit your images here!

We want to show off your images and what our tools are capable of! If you would like to see the rules for submission you can see those here.

Morris Satin was the winner for January-February and you can see that image (and our previous images that won) here!

SEM and EDS Short Course

The Materials Characterization Facility (MCF) at Georgia Tech will offer a short course on “Scanning Electron Microscopy and Energy Dispersive X-ray Spectrometry (EDS)” on October 8 & 9, 2018. This 2-day short course combines lectures and laboratory, and is designed for individuals interested in hands-on training in scanning electron microscopy techniques.

This short course will cover essential signal generation and detection techniques, including secondary and backscatter electrons, X-rays, low voltage imaging, and sample preparation techniques. Attendees will learn how to adjust operating conditions to gain valuable information about material samples. This course is suitable for both new and experienced researchers.

Target Audience

Attendance is open to researchers from academia, industry and government laboratories/organizations as well as to current Georgia Tech students, IEN and MCF users. Anyone who is interested in characterization of materials is invited and strongly encouraged to participate. The concepts and techniques presented are broadly applicable to materials.

Rates (Includes Lunch)

* Georgia Tech Rate: $150

* Academic and Government Rate: $250

* Industry Rate: $500

Registration and additional details may be found here

MCF Image Contest!

The MCF Image Contest is still going strong! Please consider sending your images/spectra so we can highlight what you are doing to the Georgia Tech Community and beyond!

More information as to how to submit your images and our guidelines can be found here:

To see past images that have been submitted, they can be found here:

Thank you!

-MCF Staff-