Webinar: February 6, 2018!
If you are interested in learning the basics of quantitative analysis using HighScore Plus X-ray Diffraction software, then join us for a free webinar. This webinar will introduce standard XRD quantitative methods, as well as the newest quantitative methods implemented in HighScore Plus software, such as Partial Least Squares Refinement (PLSR), Autoscaler Method (FULLPAT), and Direct Derivation Method after Toraya.
At the conclusion of the presentation a live question and answer session will be held. So do not miss this opportunity to learn about the newest methods for quantification by XRD, and which may be best suited to your types of materials.
This webinar will be broadcast in the lobby of the MCF in the Marcus Nanotechnology Building.
Date: February 6, 2018
Title: Introduction to quantitative XRD methods using HighScore Plus
Time: 10:00 AM EDT / 7:00 AM PDT
Duration: 45 minutes
Presenter: Dr. Anasuya Adibhatla Ph.D, XRD application specialist, Malvern Panalytical
If you are interested in characterizing both biological and synthetic nanoparticles, then join us for a free webinar. We will look at optimal conditions for extruding liposomes and will analyze their stability under different conditions. Our aim is to further educate the public about the intricacies of liposome formation and characterization as measured by nanoparticle tracking analysis (NTA) from the NanoSight product range, dynamic and electrophoretic light scattering (DLS/ELS) from the Zetasizer product range, and small-angle and wide-angle X-ray scattering (SAXS/WAXS) from the X-ray analytical product range within Malvern Panalytical.
This webinar will be on display in the lobby of the MCF in the Marcus Building.
Title: Characterizing liposome formation, structure and stability with complementary techniques
Time: 1:00 PM (GMT-05:00) Eastern [New York]
Duration: 60 minutes
Presenters: Ragy Ragheb, technical specialist at Malvern Panalytical and
Joerg Bolze, product specialist XRD at Malvern Panalytical
Introduction to Practical X-ray Powder Diffractometry
This presentation teaches the basic principles of X-ray diffraction and what information can be learned from an X-ray diffraction pattern. This presentation does not delve deeply into the mathematics or physics of diffraction, but rather focuses on illustrating the power of this materials analysis technique. It is intended for a broad audience—technicians, managers, students, professor moving from single crystal diffractometry into powder diffractometry, and those who are considering if X-ray diffraction could be a beneficial addition to their lab.
X-Ray Powder Diffraction is most often used to answer the questions: what is in the sample and how much? With modern diffractometers, it is possible to load a sample, push a single button, and get an answer. But … where did that answer come from? How reliable is it? What other information might be available in the data? This talk will dissect the X-ray powder diffraction pattern and show the wealth of information contained within.
More information can be found here.
The Aeris is a benchtop XRD capable of quick high resolution scans on powder samples or small solid samples. Conveniently it operates without the need of chiller water to operate and doesn’t have any exotic power requirements. Malvern PANalytical graciously allowed the Aeris to be housed in the Marcus Building and let students use it free of charge and several groups took advantage of it.