MCF Technical Lecture Series:
- Thursday, December 14th 12:00 – 1:30 (NOTE TIME CORRECTION!)
- Paper Tricentennial Building Seminar Hall – Room 114
- Pizza and Drinks will be served
Scanning Transmission Electron Microscopy – Technology and Applications
C.T. (Tom) Schamp, Ph.D.
Principal Consulting Scientist
Materials Analytical Services, LLC
The Scanning Transmission Electron Microscope (STEM) has evolved from a niche research-lab apparatus to arguably the leading electron microscopy analysis technique humanity has devised. In this presentation, I will discuss general principals of the STEM and aberration correction with an emphasis on making the concepts readily accessible. Then I will discuss examples of how the STEM is being or has been used to obtain data from nearly every conceivable signal available, including three-dimensional data.
Introduction to Practical X-ray Powder Diffractometry
This presentation teaches the basic principles of X-ray diffraction and what information can be learned from an X-ray diffraction pattern. This presentation does not delve deeply into the mathematics or physics of diffraction, but rather focuses on illustrating the power of this materials analysis technique. It is intended for a broad audience—technicians, managers, students, professor moving from single crystal diffractometry into powder diffractometry, and those who are considering if X-ray diffraction could be a beneficial addition to their lab.
X-Ray Powder Diffraction is most often used to answer the questions: what is in the sample and how much? With modern diffractometers, it is possible to load a sample, push a single button, and get an answer. But … where did that answer come from? How reliable is it? What other information might be available in the data? This talk will dissect the X-ray powder diffraction pattern and show the wealth of information contained within.
More information can be found here.