MCF is adding another XRD!

X-Ray Diffraction (XRD) is a powerful tool to look at crystals for characterizing microstructural and crystallographic properties of powders, thin films, fibers and other solid materials. The MCF has recently added another XRD, a Malvern PANalytical MPD to its capabilities. This XRD has a flat sample stage (default) for the analysis of powders and small solids, a non-ambient stage capable of running from -196C-450C, and a reflectivity stage. It should be on SUMS no later than 8/12/2019!

Image result for ford xrd gatech

Webinar – How is Particle Size Measured

October 23
10:30 ET
The MCF will be showing this webinar on the monitor in Marcus at 10:30AM on October 23rd.
There is a gamut of particle size distribution measurement techniques each with established history and advantages.

The killer word in particle size distribution is the last one (distribution) and measurement of broad distributions is the bane of all sizing techniques.

After a very short introduction to ‘how much sample should we measure to describe the distribution’, we’ll be running through the background of some of the more popular techniques (sieves, sedimentation, electrical-sensing zone) and will emphasize the popular light scattering techniques of laser diffraction and dynamic light scattering.

As an aside, we’ll be mentioning Small-Angle X-ray Scattering (SAXS).