Tag: AFM

Atomic Force Microscopy

Bruker Dimension Icon Scanning Probe Microscopy
Performs all major SPM imaging like…

  • Peak Force Tapping
  • Contact Mode
  • Lateral Force Mode (LFM)
  • Electric Force Mode (EFM)
  • Magnetic Force Mode (MFM)
  • Fluid Imaging
  • Kelvin Probe Microscopy (KPFM)
  • Phase Imaging
  • Lift Mode
  • Force Spectroscopy
  • Force Volume
  • Surface Potential
  • Torsional Resonance (TR) Mode
  • Piezoresponse Microscopy

Samples up to 210 mm in dia/ 15 mm thick; Vertical range (Z) upto 13 microns; X,Y scan range -90 x 90 microns

Special Features

    • Can measure ultra low current between probe tip and sample using PeakForce TUNA Mode.
    • Can measure variation in conductivity and locate electrical defects of conductive samples using CAFM Mode.
    • New DataCube TUNA & SCM Modes provide Nanoelectrical & Nanomechanical spectra at every point.
    • Force Volume & Scan Asyst Probe Capabilities with user friendly software.

MCF Image Contest!

The MCF Image Contest is still going strong! Please consider sending your images/spectra so we can highlight what you are doing to the Georgia Tech Community and beyond!

More information as to how to submit your images and our guidelines can be found here: https://mcf.gatech.edu/news/image-contest-guidelines/

To see past images that have been submitted, they can be found here: https://mcf.gatech.edu/monthly-image-contest-results/

Thank you!

-MCF Staff-