News

Webinar on XRR in the Marcus Lobby on Dec 15th, 2016

Do you want to collect high-quality X-ray reflectometry data? Good practices that will help

X-ray reflectometry (XRR) is a well-established analytical method for the characterization of thin layered structures, surfaces and interfaces. It is used to determine layer thicknesses and densities and provides roughness-related information. The basics of XRR and the analysis of XRR data were discussed in a previous webinar. This time, the focus will be on a typical workflow, from setting up the X-ray optics of a diffractometer, the essential steps of the sample alignment procedures to the final XRR measurement.
Don’t miss the useful practices and tips that we will share with you in this webinar. They will help you to collect high-quality XRR data from your layered samples.

Webinar details

December 15, 2016
10:00am EDT New York or 4:00pm CET the Netherlands

More information can be found here.

Will be displayed on the main monitor in the lobby of the MCF in the Marcus Nanotechnology Building.

Webinar: See how material research is made easy!

Materials research is everywhere – from pharmaceuticals over geological exploration to research on the latest nanomaterials. In all these fields X-ray diffraction (XRD) is a key tool.
PANalytical’s new benchtop X-ray diffractometer has been designed for easy everyday analysis of your materials. Yet, the performance of the instrument is what you would previously only have expected from a full-power, large floor-standing X-ray diffraction system. What is more, the system allows for the use of an non-ambient stage for the study of changes in your materials at temperatures up to 500 °C. More information can be found here.

 

Omniprobe 200 installation in September for FEI Nova FIB/SEM for TEM sample preparation, nanoscale testing, etc

The IEN MCF is proud to announce the delivery and installation of an Oxford Instruments Omniprobe 200 nanomanipulator for the FEI Nova Nanolab 200 FIB/SEM.  This closed loop nanomanipulator has significant automation and will speed TEM lamella preparation and automate most of that process.  The system is very user-friendly and will also enable nanoscale testing of various kinds, with the option to get additional packages for different kinds of testing, particularly electrical characterization.  More information will be provided once the installation date is finalized, but tentative installation is set for the third week of September.  A link to the information on that system is below:

http://www.oxford-instruments.com/products/nanomanipulation/nanomanipulator/omniprobe-200

Webinar – Introducing the Empyrean Nano edition, a versatile X-ray scattering platform

SAXS/WAXS and more: Introducing the Empyrean Nano edition, a versatile X-ray scattering platform

The Webinar will be displayed on the main monitor in the lobby of the characterization suite in the Marcus Nanotechnology Center at 10:00AM on September 1st.

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In this webinar, PANalytical will introduce to you the main features of this instrument and demonstrate its unique capabilities by discussing several application examples.

The Empyrean Nano edition enables a variety of X-ray scattering techniques that can be applied for the structural characterization of nanomaterials on multiple length scales. The instrument is based on a high-resolution goniometer platform and the proven PreFIX concept, thus offering maximum flexibility. Main applications are SAXS/WAXS, bio-SAXS, USAXS and total scattering (PDF analysis).

More information can be found here.

Webinar – Solving the challenges of Na-ion battery electrodes using PXRD

The Webinar will be displayed on the main monitor in the lobby of the characterization suite in the Marcus Nanotechnology Center at 10:00AM on July 28th.

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Sodium layered oxides, NaxMO2 (M = Ti – Cu), show great promises as positive electrode material candidates for Na-ion batteries. However, detailed structural analysis of these materials presents many difficulties owing to their reactivity in ambient conditions, numerous structural transitions as a function of the sodium content and extended stacking fault occasionally resulting in partial amorphization of the sample.

This webinar will cover the study of P2-NaxFe1/2Mn1/2O2 positive electrode material focusing on the powder X-ray diffraction (PXRD) data collection strategies used to address the challenges inherent to sodium layered oxide in general.

More information can be found here.

 

XRF Webinar to play in Marcus Lobby – July 14th

We will be presenting a Webinar about XRF (X-ray fluorescence) from Bruker on the large monitor in Marcus on July 14th at 10:00AM.

XRF  is a non-destructive analytical technique used to determine the elemental composition of materials. XRF analyzers determine the chemistry of a sample by measuring the fluorescent (or secondary) X-ray emitted from a sample when it is excited by a primary X-ray source.

The webinar will describe how the M4 TORNADO can be used to identify high and low angle grain boundaries as well as twin boundaries in crystalline materials. From polycrystalline silicon wafers to aluminum samples and welding joint, the method presented in this webinar allows the user to obtain information on the crystals such as size and distribution.

csm_polycrystalline-silicon-wafer_w380px_76b61d2674

More information can be found here.

If XRF is a technique that your research group is particularly interested in, please contact me at david.tavakoli at mse.gatech.edu.

Low-voltage EDS & SEM webinar on screen in lobby

Attention Users:

Bruker & Hitachi are having a webinar on low-voltage EDX and SEM imaging that we will be streaming on the monitor in the MCF lobby on Tuesday at 4pm (e.g. tomorrow).  It will run 4pm-4:45pm.  Staff will be available for questions afterwards.  The agenda is as follows:

Think Outside the Lab for advanced imaging with the latest Cold-Field-Emission SEM and FlatQUAD Energy Dispersive Spectrometer (EDS) for high-speed and high-sensitivity X-ray microanalysis.

Hitachi High Technologies & Bruker Nano Analytics invite you to a free webinar, “Energy Dispersive Spectroscopy with CFE Technology.” Registration is required. Please register today!

Agenda:

 

 

MCF staff co-authors on Microscopy Today article

Two MCF staff members, Todd Walters and Eric Woods, are co-authors on a new paper recently published in Microscopy Today with primary author Yoichiro Hashimoto from Hitachi High-Technologies Corp.  This paper demonstrates the behavior of various materials under beam voltages (accomplished via deceleration) from 0.2-1.0kV in the Hitachi 8230 and compares experimental and reference / predicted behavior in contrast in BSE images under those conditions.

Hashimoto – Image contrast in EF BSE images at ultra low accel voltages – Mic Today – 2016