News

MCF April Image Contest

The month of April is coming to a close, but it isn’t too late to submit an image to our image contest!

You can submit your image here!

If you would like to see all of our previous winners, you can see them here!

And congratulations to our winners in March 2019, Sang Yun Han, Erkul Karacauglu and Katherine Young!

 

 

Enter the EnvisioNano Image Contest! Deadline Dec 31, 2018!

EnvisioNano is a contest for undergraduate and graduate students conducting nanotechnology research in the United States and U.S. territories. Students should submit striking nanoscale images that demonstrate how beautiful the nanoscale can be alongside thoughtful, concise descriptions of the research behind the picture and how it may lead to nanotechnologies that benefit society. The goal is to envision where your research is headed and explain how “seeing” at the nanoscale is important to reaching that vision.  See the most recent winning image here!

For details and submission guidelines, please go here: https://www.nano.gov/EnvisioNano

December 2018 Image Contest is Live!

The December Image Contest is live and you can submit your images here!

If you have questions about the submission guidelines for the contest, those can be found on our website here.

And if you would like to see our previous winners (and congratulations to our winners in September and October), those images can be found here. The winner of the November contest will be posted by the end of this week.

If you have questions or concerns, please feel free to contact MCF Staff.

November 2018 Image Contest

The November Image Contest is live and you can submit your images here!

If you have questions about the submission guidelines for the contest, those can be found on our website here.

And if you would like to see our previous winners, those images can be found here.

If you have questions or concerns, please feel free to contact MCF Staff.

Webinar – How is Particle Size Measured

Masterclass
October 23
10:30 ET
The MCF will be showing this webinar on the monitor in Marcus at 10:30AM on October 23rd.
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There is a gamut of particle size distribution measurement techniques each with established history and advantages.

The killer word in particle size distribution is the last one (distribution) and measurement of broad distributions is the bane of all sizing techniques.

After a very short introduction to ‘how much sample should we measure to describe the distribution’, we’ll be running through the background of some of the more popular techniques (sieves, sedimentation, electrical-sensing zone) and will emphasize the popular light scattering techniques of laser diffraction and dynamic light scattering.

As an aside, we’ll be mentioning Small-Angle X-ray Scattering (SAXS).

MCF Image Contest for October

The image contest for the October is now live and you can submit your images here!

If you have questions about the submission guidelines for the contest, those can be found on our website here.

And if you would like to see our previous winners, those images can be found here.

If you have questions or concerns, please feel free to contact MCF Staff.

SEM and EDS Short Course

The Materials Characterization Facility (MCF) at Georgia Tech will offer a short course on “Scanning Electron Microscopy and Energy Dispersive X-ray Spectrometry (EDS)” on October 8 & 9, 2018. This 2-day short course combines lectures and laboratory, and is designed for individuals interested in hands-on training in scanning electron microscopy techniques.

This short course will cover essential signal generation and detection techniques, including secondary and backscatter electrons, X-rays, low voltage imaging, and sample preparation techniques. Attendees will learn how to adjust operating conditions to gain valuable information about material samples. This course is suitable for both new and experienced researchers.

Target Audience

Attendance is open to researchers from academia, industry and government laboratories/organizations as well as to current Georgia Tech students, IEN and MCF users. Anyone who is interested in characterization of materials is invited and strongly encouraged to participate. The concepts and techniques presented are broadly applicable to materials.

Rates (Includes Lunch)

* Georgia Tech Rate: $150

* Academic and Government Rate: $250

* Industry Rate: $500

Registration and additional details may be found here

MCF Image Contest!

The MCF Image Contest is still going strong! Please consider sending your images/spectra so we can highlight what you are doing to the Georgia Tech Community and beyond!

More information as to how to submit your images and our guidelines can be found here: https://mcf.gatech.edu/news/image-contest-guidelines/

To see past images that have been submitted, they can be found here: https://mcf.gatech.edu/monthly-image-contest-results/

Thank you!

-MCF Staff-