The MCF will be hosting a lecture on Atom Probe Tomography with scientists from Cameca on Wednesday, September 11, 2019 from 12:00 PM to 1:00 PM EDT .
This talk will cover APT operational theory, an introduction to sample prep and data reconstruction, and an overview of various applications. A commercial cryo-UHV solution for FIB-APT specimen transfer will also be presented.
If you would like to sign up, you can you do so here!
MCF Technical Lecture Series:
Scanning Transmission Electron Microscopy – Technology and Applications
C.T. (Tom) Schamp, Ph.D.
Principal Consulting Scientist
Materials Analytical Services, LLC
Suwanee, GA
The Scanning Transmission Electron Microscope (STEM) has evolved from a niche research-lab apparatus to arguably the leading electron microscopy analysis technique humanity has devised. In this presentation, I will discuss general principals of the STEM and aberration correction with an emphasis on making the concepts readily accessible. Then I will discuss examples of how the STEM is being or has been used to obtain data from nearly every conceivable signal available, including three-dimensional data.