Tag: XRF

Next MCF Image Contest in live until June 30, 2024!

1st place - The Beauty of Cancer Cells
1st place from the last image contest: Aref Valipour, F. Sarioglu Group Hitachi SU 8230 SEM

The Materials Characterization Facility hosts a running image contest that resets bimonthly. The current image contests will run through June 30, 2024.  In addition to displaying some of the imaging and analysis capabilities of our labs, it gives our users a chance to display their creative side. Check back here the first week of each month for updates on submission and in June we will announce our annual winners.

To submit your images, please go here!

https://gatech.infoready4.com/#competitionDetail/1934698

More information on the contest, rules, and how to make submissions can be found here

https://mcf.gatech.edu/news/

Example of Previous Submissions and Winners

https://mcf.gatech.edu/monthly-image-contest-results/

New Image Contest Is Live!

The Materials Characterization Facility hosts a running image contest that resets bimonthly. The current image contests will run through March 31, 2024.  In addition to displaying some of the imaging and analysis capabilities of our labs, it gives our users a chance to display their creative side. Check back here the first week of each month for updates on submission and in June we will announce our annual winners.

Ag (111) surface

To submit your images, please go here!

https://gatech.infoready4.com/#competitionDetail/1925070

More information on the contest, rules, and how to make submissions can be found below

https://mcf.gatech.edu/news/

Image Contest Rules:

Example of Previous Submissions and Winners.

Bruker XRF Webinar December 6th

Bruker Tornado doors open

Bruker will be hosting a webinar on quantitative XRF this coming Tuesday. The MCF will be playing the webinar in the lobby of Characterization Facility in Marcus.

In this webinar, Bruker will present potentials for quantification from simple to complex specimens, from infinitely thick to thin, from ideal to non-ideal samples. The possibilities to optimize the analytical output will be elaborated on using example cases. A discussion on detection limits and develop potential improvements and parameter optimization will also be had.

If you would like to register to watch it at your own concenience, you can sign up for it here.

X-Ray Fluorescence (XRF) at the MCF

Elemental map of a chip

The MCF is pleased to announce the installation of its latest X-Ray tool, the Bruker Tornado X–Ray Fluorescence (XRF) spectrometer. Featuring two sources, two detectors, and an automatic stage with micron-level positioning accuracy; the XRF is capable of measuring elements from C to U with a spot size down to 20um for high resolution elemental mapping of materials and devices.

In addition, advanced software packages: XMethod – for layer thickness calculation and AMICS – for automated mineral determination are available to users for sample analysis. 

More information about the instrument and its capabilities will be updated on its webpage.

The tool is currently available for use and is available for requests for training on SUMS.

If you have questions about its capabilities please contact David Tavakoli: atavakoli6@gatech.edu

Rigaku Virtual Conference on XRD and XRF August 4-6!

Rigaku will be hosting a virtual conference on XRD and XRF this week that is free to register here!

Due to the COVID-19 induced cancellations of the Microscopy & MicroAnalysis, Denver X-ray, and American Crystallographic Association physical conferences this summer, Rigaku will be live webcasting a 3-day virtual Analytical X-ray Convention from our laboratory facility in Texas. The webcasts will take place Tuesday 8/4 – Thursday 8/6 and will feature live seminars on X-ray techniques and live instrument demonstrations.

Enjoy the presentations on Channel 1 (XRD), Channel 2 (XRF) and Channel 3 (X-ray Microscopy), and make sure to stop by our Concierge Booth on Channel 4 to say hello, live video chat, and participate in some fun events. We will be announcing upcoming Channel 4 events on the channel itself and via our Rigaku twitter feed (@rigaku, hashtag #RAXC2020), which you can view see on the right to keep up to date with what is going on.

Check the starting times for each day in the program, as different channels have different starting times. All four channels will be broadcast simultaneously and you can move among the four booths using the channel links.

Note that the three guest presentations—to be given by Rigaku sponsors—will all take place on channel 3. This has been updated on the program schedule.

Webinar – XRF Theory

X-ray fluorescence spectrometry (XRF) is a powerful technique for the analysis of elemental compositions of solid, powdered, and liquid materials. It can deliver high precision, quantitative results for both process control and completely unknown samples using purpose built calibrations.

High quality results can also be obtained using powerful standardless analysis software. This webinar covers the basics of the technique, extent of its capabilities, instrument types, and touches on the important topic of sample preparation. The webinar is geared toward those with little or no experience with XRF wishing to learn more and will be displayed in the lobby of the MCF in the Marcus Nanotechnology Building at 10:00AM on June 7, 2017.

More details can be found here.

XRF Webinar – Different Approaches to Bulk Quantification – June 1st, 2017

In XRF there are different approaches to the quantification of spectra from bulk samples. Every quantification approach has specific strengths and weaknesses, but the M4 TORNADO’s “tool box” of suitable quantification methods provides you with appropriate options when it comes to quantification of non-ideal sample types.
The webinar will be rounded off by a 15-minute Q&A session where our experts will answer your questions.

It will be displayed in the main lobby of the MCF in the Marcus Nanotechnology Building at 11:00AM on June 1st.

XRF Webinar to play in Marcus Lobby – July 14th

We will be presenting a Webinar about XRF (X-ray fluorescence) from Bruker on the large monitor in Marcus on July 14th at 10:00AM.

XRF  is a non-destructive analytical technique used to determine the elemental composition of materials. XRF analyzers determine the chemistry of a sample by measuring the fluorescent (or secondary) X-ray emitted from a sample when it is excited by a primary X-ray source.

The webinar will describe how the M4 TORNADO can be used to identify high and low angle grain boundaries as well as twin boundaries in crystalline materials. From polycrystalline silicon wafers to aluminum samples and welding joint, the method presented in this webinar allows the user to obtain information on the crystals such as size and distribution.

csm_polycrystalline-silicon-wafer_w380px_76b61d2674

More information can be found here.

If XRF is a technique that your research group is particularly interested in, please contact me at david.tavakoli at mse.gatech.edu.