The MCF will be showing a webinar on the new Malvern PANalytical Empyrean in the lobby tomorrow, Wednesday, December 18, 2019 from 10:30-11:30AM,
DEMO AT YOUR DESK – FLOOR STANDING XRD – THE EMPYREAN 3RD GENERATION
Join us for a demonstration of the New Empyrean 3rd generation X-ray diffractometer. Like no other system available, the Empyrean is designed for now, and for years to come. A fully automated series of 6 samples will be demonstrated using several different measurements types, including reflection geometry, SAXS, 2D transmission, texture, residual stress, thin film reflectivity, and grazing incidence XRD. The Optics enable the analyst a large variety of measurements without manual intervention. The predefined batch function with data collector has the programming power to switch between measurement types seamlessly. The world of materials science is constantly changing and the life of a high performance diffractometer like the Empyrean 3rd generation will deliver results that save time and effort,as well as, ensure accuracy of the experimental set up.
– Anyone interested in XRD and the innovation of the floor standing X-ray diffraction platform
If you wish to watch this demonstration at your own desk or elsewhere, you can register for it here.
X-Ray Diffraction (XRD) is a powerful tool to look at crystals for characterizing microstructural and crystallographic properties of powders, thin films, fibers and other solid materials. The MCF has recently added another XRD, a Malvern PANalytical MPD to its capabilities. This XRD has a flat sample stage (default) for the analysis of powders and small solids, a non-ambient stage capable of running from -196C-450C, and a reflectivity stage. It should be on SUMS no later than 8/12/2019!
The Malvern PANalytical Empyrean in the MCF was featured prominently in a story recently posted online!
Many thanks to Neha Kondekar and Xenia Wirth as well as the MSE 2021 class for agreeing to participate!
If you would like to see the blog post, you can see it here!
The core facility for materials analysis at Georgia Tech is the IEN/IMat Materials Characterization Facility (MCF). The MCF is available to academic, industry and government users; it merges several labs on Georgia Tech’s campus and offers a variety of microscopy and characterization tools as well as skilled research staff to support research needs. Offering 24-hour a day shared-user access to the latest in imaging and analysis technology, and operated on a fee rate schedule, the MCF facility provides services for researchers including equipment training, remote sample prep and measurement, and imaging and analysis consultations.
MCF also happens to be where this top public research university and institute of technology houses their Malvern Panalytical Empyrean X-ray diffraction (XRD) instrument. The Empyrean XRD system generates X-rays, directs them toward a sample, and collects diffracted rays (the angle between the incident and the diffracted beam). Collected data are widely used for the identification of unknown crystalline materials (e.g. minerals, inorganic compounds), quantification of crystalline and amorphous materials, thin film thickness and structure, and many more applications. These applications are critical to studies in geology, environmental science, material science, engineering and biology.