Webinar – XRF Theory

X-ray fluorescence spectrometry (XRF) is a powerful technique for the analysis of elemental compositions of solid, powdered, and liquid materials. It can deliver high precision, quantitative results for both process control and completely unknown samples using purpose built calibrations.

High quality results can also be obtained using powerful standardless analysis software. This webinar covers the basics of the technique, extent of its capabilities, instrument types, and touches on the important topic of sample preparation. The webinar is geared toward those with little or no experience with XRF wishing to learn more and will be displayed in the lobby of the MCF in the Marcus Nanotechnology Building at 10:00AM on June 7, 2017.

More details can be found here.

XRF Webinar – Different Approaches to Bulk Quantification – June 1st, 2017

In XRF there are different approaches to the quantification of spectra from bulk samples. Every quantification approach has specific strengths and weaknesses, but the M4 TORNADO’s “tool box” of suitable quantification methods provides you with appropriate options when it comes to quantification of non-ideal sample types.
The webinar will be rounded off by a 15-minute Q&A session where our experts will answer your questions.

It will be displayed in the main lobby of the MCF in the Marcus Nanotechnology Building at 11:00AM on June 1st.

XRF Webinar to play in Marcus Lobby – July 14th

We will be presenting a Webinar about XRF (X-ray fluorescence) from Bruker on the large monitor in Marcus on July 14th at 10:00AM.

XRF  is a non-destructive analytical technique used to determine the elemental composition of materials. XRF analyzers determine the chemistry of a sample by measuring the fluorescent (or secondary) X-ray emitted from a sample when it is excited by a primary X-ray source.

The webinar will describe how the M4 TORNADO can be used to identify high and low angle grain boundaries as well as twin boundaries in crystalline materials. From polycrystalline silicon wafers to aluminum samples and welding joint, the method presented in this webinar allows the user to obtain information on the crystals such as size and distribution.

csm_polycrystalline-silicon-wafer_w380px_76b61d2674

More information can be found here.

If XRF is a technique that your research group is particularly interested in, please contact me at david.tavakoli at mse.gatech.edu.