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MCF Lecture Series – Scanning Transmission Electron Microscopy – Technology and Applications 

MCF Lecture Series – Scanning Transmission Electron Microscopy – Technology and Applications 

MCF Technical Lecture Series: 

  • Thursday, December 14th 12:00 – 1:30 (NOTE TIME CORRECTION!)
  • Paper Tricentennial Building Seminar Hall – Room 114
  • Pizza and Drinks will be served 

Scanning Transmission Electron Microscopy – Technology and Applications 

C.T. (Tom) Schamp, Ph.D. 

Principal Consulting Scientist 

Materials Analytical Services, LLC 

Suwanee, GA 

 

The Scanning Transmission Electron Microscope (STEM) has evolved from a niche research-lab apparatus to arguably the leading electron microscopy analysis technique humanity has devised. In this presentation, I will discuss general principals of the STEM and aberration correction with an emphasis on making the concepts readily accessible. Then I will discuss examples of how the STEM is being or has been used to obtain data from nearly every conceivable signal available, including three-dimensional data.