The New Raman Renishaw Particle Analysis Software – Targeted Raman Data Collection
Wednesday, September 30th – 2:00pm (EST)
Renishaw’s upcoming Particle Analysis software enables targeted Raman data collection from optical image contrast. This approach ensures data is only collected from the areas of interest, making it a fast and automated method.
In this webinar, we will show how the diverse high performing optical contrast methods of the inVia Raman microscope can be used to quickly, easily, and automatically report particle identities and morphology together. Applied to a diverse range of applications, from microplastics to materials and forensics to pharmaceuticals, see how Particle Analysis can benefit your work.
This webinar will be broadcast in the MCF Lobby in the Marcus Nanotechnology Building.
Register for it here!