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GT - IEN/IMAT Materials Characterization Facility
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    • MCF – Imaging & Microanalysis
    • MPCF -Mechanical Property Testing
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    • Mechanical Property Testing
    • Molecular and Organic Analysis Techniques
    • Scanning Electron Microscopy (SEM)
      • Hitachi SU8010
      • Hitachi SU-8230 SEM
      • LEO 1530 SEM
      • Zeiss Ultra 60 SEM
      • Thermo Helios 5 CX
      • Thermo Axia ChemiSEM
    • Transmission Electron Microscopy (TEM)
    • Spectroscopy & Optical Techniques
    • Scanning Probe Microscopy (SPM)
    • Surface Science
    • X-Ray Diffraction (XRD)
    • Sample Prep Equipment
  • Tools
    • List of Tools
    • JEOL 100CX-II TEM
    • Hitachi HT-7700 TEM
    • Hitachi HD-2700 aberration corrected STEM
    • FEI Tecnai G2 F30 TEM
    • Bruker Dimension ICON AFM
    • Hysitron triboindenter
    • Renishaw Qontor Confocal Raman Microscope
    • iN10MX FTIR Microscope
    • Nicolet 6700 FTIR Spectrometer
    • Keyence Digital Microscopes
    • Kratos Axis Ultra XPS/UPS
    • Thermo K-alpha XPS
    • IONTOF ToF-SIMS
    • Malvern PANalytical Empyrean
    • Malvern PANalytical Alpha-1
    • Malvern PANalytical MRD
    • Rigaku Miniflex
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