The IEN MCF is proud to announce the delivery and installation of an Oxford Instruments Omniprobe 200 nanomanipulator for the FEI Nova Nanolab 200 FIB/SEM. This closed loop nanomanipulator has significant automation and will speed TEM lamella preparation and automate most of that process. The system is very user-friendly and will also enable nanoscale testing of various kinds, with the option to get additional packages for different kinds of testing, particularly electrical characterization. More information will be provided once the installation date is finalized, but tentative installation is set for the third week of September. A link to the information on that system is below:
Bruker & Hitachi are having a webinar on low-voltage EDX and SEM imaging that we will be streaming on the monitor in the MCF lobby on Tuesday at 4pm (e.g. tomorrow). It will run 4pm-4:45pm. Staff will be available for questions afterwards. The agenda is as follows:
Think Outside the Lab for advanced imaging with the latest Cold-Field-Emission SEM and FlatQUAD Energy Dispersive Spectrometer (EDS) for high-speed and high-sensitivity X-ray microanalysis.
Hitachi High Technologies & Bruker Nano Analytics invite you to a free webinar, “Energy Dispersive Spectroscopy with CFE Technology.” Registration is required. Please register today!
- Advanced low–voltage imaging with the Hitachi SU8200 Series CFE-SEM
- Bruker QUANTAX FlatQUAD EDS
- Q & A
Two MCF staff members, Todd Walters and Eric Woods, are co-authors on a new paper recently published in Microscopy Today with primary author Yoichiro Hashimoto from Hitachi High-Technologies Corp. This paper demonstrates the behavior of various materials under beam voltages (accomplished via deceleration) from 0.2-1.0kV in the Hitachi 8230 and compares experimental and reference / predicted behavior in contrast in BSE images under those conditions.