A new focus ion beam (FIB) from Thermo Scientific will be installed in MCF. This FIB, Helios 5 CX dualbeam ,  is to replace the old Nova 200 FIB-SEM which is removed from campus.

This new FIB will be equipped with highly automated, multisite, fastest and easiest sample preparation for S/TEM.
Extreme high resolution (1nm) at low acceleration voltage 1kV can be achieved in SEM mode.
Acceleration voltage for SEM is 200V-30kV.
Acceleration voltage for ion beam is 500V-30kV.

For more information with regards to training or use of this facility, please contact Mengkun Tian.

Helios 5 CX DualBeam for Materials Science