X-Ray Diffraction (XRD) is a powerful tool to look at crystals for characterizing microstructural and crystallographic properties of powders, thin films, fibers and other solid materials. The MCF has recently added another XRD, a Malvern PANalytical MPD to its capabilities. This XRD has a flat sample stage (default) for the analysis of powders and small solids, a non-ambient stage capable of running from -196C-450C, and a reflectivity stage. It should be on SUMS no later than 8/12/2019!
