Two MCF staff members, Todd Walters and Eric Woods, are co-authors on a new paper recently published in Microscopy Today with primary author Yoichiro Hashimoto from Hitachi High-Technologies Corp. This paper demonstrates the behavior of various materials under beam voltages (accomplished via deceleration) from 0.2-1.0kV in the Hitachi 8230 and compares experimental and reference / predicted behavior in contrast in BSE images under those conditions.
Hashimoto – Image contrast in EF BSE images at ultra low accel voltages – Mic Today – 2016