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IMS Materials Characterization Facility

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    • MCF – Imaging & Microanalysis
    • MPCF -Mechanical Property Testing
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    • Mechanical Property Testing
    • Molecular and Organic Analysis Techniques
    • Scanning Electron Microscopy (SEM)
      • Hitachi SU8010
      • Hitachi SU-8230 SEM
      • LEO 1530 SEM
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      • Thermo Helios 5 CX
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    • Transmission Electron Microscopy (TEM)
      • JEOL 100CX-II TEM
      • Hitachi HT-7700 TEM
      • Hitachi HD-2700 aberration corrected STEM
      • FEI Tecnai G2 F30 TEM
    • Spectroscopy & Optical Techniques
    • Scanning Probe Microscopy (SPM)
      • Bruker Dimension ICON AFM
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      • Kratos Axis Ultra XPS/UPS
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      • IONTOF ToF-SIMS
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    • EasyXAFS Brimstone System
    • Thermo iCAP ICP-MS
    • Sample Prep Equipment
  • Tools
    • List of Tools
    • Renishaw Qontor Confocal Raman Microscope
    • iN10MX FTIR Microscope
    • Nicolet 6700 FTIR Spectrometer
    • Keyence Digital Microscopes
    • Malvern PANalytical Empyrean
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    • Malvern PANalytical MRD
    • Rigaku Miniflex
    • Bruker Tornado M4+
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Introduction to Confocal Raman microscopy_Renishaw

Introduction to Confocal Raman microscopy_Renishaw

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