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GT - IEN/IMAT Materials Characterization Facility
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Scanning Electron Microscopy (SEM)
Transmission Electron Microscopy (TEM)
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Hitachi SU8010
Hitachi SU-8230 SEM
LEO 1530 SEM
Zeiss Ultra 60 SEM
Thermo Helios 5 CX
JEOL 100CX-II TEM
Hitachi HT-7700 TEM
Hitachi HD-2700 aberration corrected STEM
FEI Tecnai G2 F30 TEM
Bruker Dimension ICON AFM
Hysitron triboindenter
Renishaw Qontor Confocal Raman Microscope
iN10MX FTIR Microscope
Nicolet 6700 FTIR Spectrometer
Keyence Digital Microscope
Kratos Axis Ultra XPS/UPS
Thermo K-alpha XPS
IONTOF ToF-SIMS
Malvern PANalytical Empyrean
Malvern PANalytical Alpha-1
Malvern PANalytical MRD
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