Skip to main navigation
Skip to content
IMS Materials Characterization Facility
About MCF
Home
People
IMS Shared-User Charac. Facilities
IMS Shared-User Facilities
MCF – Imaging & Microanalysis
MPCF -Mechanical Property Testing
Capabilities
Capabilities
Information
Mechanical Property Testing
Molecular and Organic Analysis Techniques
Scanning Electron Microscopy (SEM)
Hitachi SU8010
Hitachi SU-8230 SEM
LEO 1530 SEM
Zeiss Ultra 60 SEM
Thermo Helios 5 CX
Thermo Axia ChemiSEM
Transmission Electron Microscopy (TEM)
JEOL 100CX-II TEM
Hitachi HT-7700 TEM
Hitachi HD-2700 aberration corrected STEM
FEI Tecnai G2 F30 TEM
Spectroscopy & Optical Techniques
Scanning Probe Microscopy (SPM)
Bruker Dimension ICON AFM
Hysitron triboindenter
Createc LT-SPM
Surface Science
Kratos Axis Ultra XPS/UPS
Thermo K-alpha XPS
IONTOF ToF-SIMS
X-Ray Diffraction (XRD)
EasyXAFS
Thermo iCAP ICP-MS
Sample Prep Equipment
Tools
List of Tools
Renishaw Qontor Confocal Raman Microscope
iN10MX FTIR Microscope
Nicolet 6700 FTIR Spectrometer
Keyence Digital Microscopes
Malvern PANalytical Empyrean
Malvern PANalytical Alpha-1
Malvern PANalytical MRD
Rigaku Miniflex
Bruker Tornado M4+
News and Image Contests
News
Image Contest Results
Image Contest Guidelines
Rates
Contact Us
FAQ
Search for:
Search
Search for:
Search
Now in main content
September2018 IC
Back to top
