Skip to main navigation
Skip to content
IEN / IMat Materials Characterization Facility
About MCF
Home
People
IMat Shared-User Facilities
IMat Shared-User Facilities
MCF – Imaging & Microanalysis
MPCF -Mechanical Property Testing
Capabilities
Capabilities
Information
Mechanical Property Testing
Molecular and Organic Analysis Techniques
Scanning Electron Microscopy (SEM)
Hitachi SU8010
Hitachi SU-8230 SEM
LEO 1530 SEM
Zeiss Ultra 60 SEM
Thermo Helios 5 CX
Thermo Axia ChemiSEM
Transmission Electron Microscopy (TEM)
JEOL 100CX-II TEM
Hitachi HT-7700 TEM
Hitachi HD-2700 aberration corrected STEM
FEI Tecnai G2 F30 TEM
Spectroscopy & Optical Techniques
Scanning Probe Microscopy (SPM)
Bruker Dimension ICON AFM
Hysitron triboindenter
Createc LT-SPM
Surface Science
Kratos Axis Ultra XPS/UPS
Thermo K-alpha XPS
IONTOF ToF-SIMS
X-Ray Diffraction (XRD)
Sample Prep Equipment
Tools
List of Tools
Renishaw Qontor Confocal Raman Microscope
iN10MX FTIR Microscope
Nicolet 6700 FTIR Spectrometer
Keyence Digital Microscopes
Malvern PANalytical Empyrean
Malvern PANalytical Alpha-1
Malvern PANalytical MRD
Rigaku Miniflex
Bruker Tornado M4+
News and Image Contests
News
Image Contest Results
Image Contest Guidelines
Rates
Contact Us
FAQ
EasyXAFS
Thermo iCAP ICP-MS
Search for:
Search
Search for:
Search
Now in main content
Aug2019_IC
Back to top
