EasyXAFS

The easyXAFS300+ system is a lab-scale device capable of performing x-ray absorption spectroscopy (XAS) and x-ray emission spectroscopy (XES) and is capable of obtaining high resolution spectra for nearly all absorption edges and emission lines within the energy range of 4.5KeV to 13KeV. The first easyXAFS300+ system to be installed in North America was installed in the MCF at Georgia Tech in 2021.

The instrument includes two different sources depending on measurement mode: a 100W Tungsten source for emission measurements and a 1200W high-flux (300,000/s) Molybdenum source for absorption measurements, featuring an assortment of silicon crystal monochromators which ensure high quality spectra. 

More information on using the instrument will be posted to this site over time.

Example of Zn Foil Spectra

An image of the internal components of the instrument

An image detailing how the instrument functions

To reserve the tool in SUMS, or to request training, please go here.

Documents

The Standard Operating Procedure (SOP) is too large to place here, but is available on the SUMS page for this tool. A compressed version of lower resolution is available here.