Webinar: Characterizing ceramic compounds using state-of-the-art X-ray diffraction (XRD)

Characterizing ceramic compounds using state-of-the-art X-ray diffraction (XRD)

This webinar will be shown on September 7th at 10:00AM in the Lobby of the Microscopy Suite in Marcus. You can register and get more information here.

Webinar abstract

Due to their wide range of composition/structures as well as the versatility of their applications ceramics are a widely studied subject within the materials sciences. Their characterization in order to determine physical and chemical properties is paramount to predict how a ceramic compound will behave in high-temperature environments. Various analytical techniques are used for the characterization of ceramics with XRD being one of them. This technique is, however, not yet exploited to its full potential. Currently it is mostly used for simple phase analysis during and after the production process and in some cases for in situ high-temperature studies.

However, modern multipurpose diffraction platforms allow more analytical approaches. They can be combined to fully characterize a ceramic compound in terms of phase composition, crystallinity (amorphous/glass content), crystallite size, 2D phase distribution, depth profiling, residual stress, texture, thermal behavior (in situ), as well as 3D microstructure.

During this webinar various case studies where XRD is used for the characterization of ceramics will be discussed, showing various analytical examples. You will learn how XRD can be applied to the different materials and analytical challenges. Case studies of the following applications will be given:
– Phase analysis using Rietveld full-pattern fitting
– Grazing incidence XRD
– Non-ambient diffraction
– Residual stress and texture
– Microdiffraction
– Computed tomography

 

Webinar – Is the X-ray diffraction theory we use correct? May 30, 2017

The theory of X-ray diffraction from crystals has been established for over 100 years; although it is still used, it cannot account for some of the experimental data. The theory combined with measured data can sometimes lead to the wrong structural model. In this webinar you will hear about a new theory that includes the diffraction from crystals in all directions, which explains the diffraction from polycrystalline materials and the data collected in serial crystallography without the need for complex structural requirements.

This webinar will be on display of the lobby of the MCF in the Marcus Nanotechnology Building at 11:00EST on May 30, 2017.

More information can be found here.

Webinar – May 23, 2017 – Beyond Cu: The many colors of X-rays – selecting the best X-ray tube for your analysis

Presented by: Scott Speakman Ph.D – XRD Principal Scientist

Modern laboratory diffractometers are designed to operate with X-ray tubes that may have many different types of anodes: Cr, Mn, Fe, Co, Cu, Mo, Ag, and more. The X-ray tube anode determines the wavelength of radiation that is produced for measurements. Despite the wide selection of anodes available, contemporary literature is dominated by research that uses Cu wavelength X-rays for powder diffraction and scattering studies—so much so that some researchers mistakenly believe it is the only choice because “everybody else uses it”. While Cu anode X-ray tubes have always been widely used in laboratory diffractometers, literature provides many examples of measurements that benefited from the use of other wavelengths of radiation, including synchrotrons and neutron beamlines.

This webinar will be streamed in the lobby of the MCF in the Marcus Nanotechnology Building on May 23 at 11:00AM.

Webinar: How to calculate a Pair Distribution Function with HighScore software

The pair distribution function (PDF) provides the probability of finding atoms separated by a certain distance; useful information about the short- and long-range ordering of the atoms in the materials can be extracted from the analysis of the PDF. Because atomic periodicity is not a requirement for the analysis, the PDF method is best suited for the analysis of amorphous and nanomaterials, but also for disordered crystalline materials.

This webinar will be displayed in the lobby of the MCF in the Marcus Nanotechnology Building on February 16th from 10:00-11:00AM.

More information can be found here.

Webinar: X-ray powder diffraction with BBHD, structure solution

A webinar from PANalytical will be shown in the lobby of the MCF in the Marcus Nanotechnology Building at 10:00AM on February 9th, 2017.

The live webinar will show how to solve a crystal structure from powder data using the Empyrean diffractometer and the HighScore software suite. We will discuss the requirements for solving a crystal structure from powder data and we will show recent examples of some vanadates among which a new larnite/belite structure. Furthermore, as phase transitions may appear as function of temperature, the best practice for high-temperature measurements will be presented.

A live question and answer session will follow the presentation.

More details can be found here.

Webinar on XRR in the Marcus Lobby on Dec 15th, 2016

Do you want to collect high-quality X-ray reflectometry data? Good practices that will help

X-ray reflectometry (XRR) is a well-established analytical method for the characterization of thin layered structures, surfaces and interfaces. It is used to determine layer thicknesses and densities and provides roughness-related information. The basics of XRR and the analysis of XRR data were discussed in a previous webinar. This time, the focus will be on a typical workflow, from setting up the X-ray optics of a diffractometer, the essential steps of the sample alignment procedures to the final XRR measurement.
Don’t miss the useful practices and tips that we will share with you in this webinar. They will help you to collect high-quality XRR data from your layered samples.

Webinar details

December 15, 2016
10:00am EDT New York or 4:00pm CET the Netherlands

More information can be found here.

Will be displayed on the main monitor in the lobby of the MCF in the Marcus Nanotechnology Building.

Webinar: See how material research is made easy!

Materials research is everywhere – from pharmaceuticals over geological exploration to research on the latest nanomaterials. In all these fields X-ray diffraction (XRD) is a key tool.
PANalytical’s new benchtop X-ray diffractometer has been designed for easy everyday analysis of your materials. Yet, the performance of the instrument is what you would previously only have expected from a full-power, large floor-standing X-ray diffraction system. What is more, the system allows for the use of an non-ambient stage for the study of changes in your materials at temperatures up to 500 °C. More information can be found here.

 

Webinar – Introducing the Empyrean Nano edition, a versatile X-ray scattering platform

SAXS/WAXS and more: Introducing the Empyrean Nano edition, a versatile X-ray scattering platform

The Webinar will be displayed on the main monitor in the lobby of the characterization suite in the Marcus Nanotechnology Center at 10:00AM on September 1st.

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In this webinar, PANalytical will introduce to you the main features of this instrument and demonstrate its unique capabilities by discussing several application examples.

The Empyrean Nano edition enables a variety of X-ray scattering techniques that can be applied for the structural characterization of nanomaterials on multiple length scales. The instrument is based on a high-resolution goniometer platform and the proven PreFIX concept, thus offering maximum flexibility. Main applications are SAXS/WAXS, bio-SAXS, USAXS and total scattering (PDF analysis).

More information can be found here.

XRF Webinar to play in Marcus Lobby – July 14th

We will be presenting a Webinar about XRF (X-ray fluorescence) from Bruker on the large monitor in Marcus on July 14th at 10:00AM.

XRF  is a non-destructive analytical technique used to determine the elemental composition of materials. XRF analyzers determine the chemistry of a sample by measuring the fluorescent (or secondary) X-ray emitted from a sample when it is excited by a primary X-ray source.

The webinar will describe how the M4 TORNADO can be used to identify high and low angle grain boundaries as well as twin boundaries in crystalline materials. From polycrystalline silicon wafers to aluminum samples and welding joint, the method presented in this webinar allows the user to obtain information on the crystals such as size and distribution.

csm_polycrystalline-silicon-wafer_w380px_76b61d2674

More information can be found here.

If XRF is a technique that your research group is particularly interested in, please contact me at david.tavakoli at mse.gatech.edu.

Hot Stage available on Empyrean

IMG_4609

The Anton-Parr 1200N hot stage is now available on the Empyrean. For those interested in phase change of their material as a function of temperature, the hot stage is capable of reaching temperatures of up to 1200 degrees Celsius under very controlled rates.